In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices.
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In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices.
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2015 nî lūn-bûn
@nan
2015年の論文
@ja
2015年論文
@yue
2015年論文
@zh-hant
2015年論文
@zh-hk
2015年論文
@zh-mo
2015年論文
@zh-tw
2015年论文
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2015年论文
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2015年论文
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name
In Situ Time-dependent Dielect ...... sm in Microelectronic Devices.
@ast
In Situ Time-dependent Dielect ...... sm in Microelectronic Devices.
@en
type
label
In Situ Time-dependent Dielect ...... sm in Microelectronic Devices.
@ast
In Situ Time-dependent Dielect ...... sm in Microelectronic Devices.
@en
prefLabel
In Situ Time-dependent Dielect ...... sm in Microelectronic Devices.
@ast
In Situ Time-dependent Dielect ...... sm in Microelectronic Devices.
@en
P2093
P2860
P356
P1476
In Situ Time-dependent Dielect ...... sm in Microelectronic Devices.
@en
P2093
André Clausner
Armand Beyer
Christoph Sander
Jürgen Gluch
Kong Boon Yeap
Martin Gall
Meike Hauschildt
Oliver Aubel
Yvonne Standke
P2860
P304
P356
10.3791/52447
P577
2015-06-26T00:00:00Z