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Q35689509-53B00021-C396-438F-9ACC-CEE84563A1C9
Q35689509-53B00021-C396-438F-9ACC-CEE84563A1C9
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http://www.wikidata.org/entity/statement/Q35689509-53B00021-C396-438F-9ACC-CEE84563A1C9
In Situ Time-dependent Dielectric Breakdown in the Transmission Electron Microscope: A Possibility to Understand the Failure Mechanism in Microelectronic Devices.
P2860
Q35689509-53B00021-C396-438F-9ACC-CEE84563A1C9
BestRank
Statement
http://www.wikidata.org/entity/statement/Q35689509-53B00021-C396-438F-9ACC-CEE84563A1C9
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550839b42b390d0890580b0b0379e0761931cba6
P2860
High-resolution low-dose scanning transmission electron microscopy.