Determination of the atomic structure of scanning probe microscopy tungsten tips by field ion microscopy
about
Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope.Conductivity of an atomically defined metallic interface.Indentation-formed nanocontacts: an atomic-scale perspective.Tip radius quantification using feature-size mapping of field ion microscopy imagesCombining low-energy electron microscopy and scanning probe microscopy techniques for surface science: Development of a novel sample-holderModelling of Atomic Imaging and Evaporation in the Field Ion Microscope
P2860
Determination of the atomic structure of scanning probe microscopy tungsten tips by field ion microscopy
description
im Dezember 2005 veröffentlichter wissenschaftlicher Artikel
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wetenschappelijk artikel
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наукова стаття, опублікована в грудні 2005
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name
Determination of the atomic st ...... n tips by field ion microscopy
@en
Determination of the atomic st ...... n tips by field ion microscopy
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type
label
Determination of the atomic st ...... n tips by field ion microscopy
@en
Determination of the atomic st ...... n tips by field ion microscopy
@nl
prefLabel
Determination of the atomic st ...... n tips by field ion microscopy
@en
Determination of the atomic st ...... n tips by field ion microscopy
@nl
P2093
P2860
P1433
P1476
Determination of the atomic st ...... n tips by field ion microscopy
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P2093
Anne-Sophie Lucier
Henrik Mortensen
Peter Grütter
P2860
P356
10.1103/PHYSREVB.72.235420
P407
P577
2005-12-19T00:00:00Z