Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope.
about
Conductivity of an atomically defined metallic interface.Indentation-formed nanocontacts: an atomic-scale perspective.Note: electrochemical etching of silver tips in concentrated sulfuric acid.Tungstate sharpening: a versatile method for extending the profile of ultra sharp tungsten probes.Combining low-energy electron microscopy and scanning probe microscopy techniques for surface science: Development of a novel sample-holder
P2860
Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope.
description
2011 nî lūn-bûn
@nan
2011 թուականի Նոյեմբերին հրատարակուած գիտական յօդուած
@hyw
2011 թվականի նոյեմբերին հրատարակված գիտական հոդված
@hy
2011年の論文
@ja
2011年論文
@yue
2011年論文
@zh-hant
2011年論文
@zh-hk
2011年論文
@zh-mo
2011年論文
@zh-tw
2011年论文
@wuu
name
Refined tip preparation by ele ...... e and atomic force microscope.
@ast
Refined tip preparation by ele ...... e and atomic force microscope.
@en
type
label
Refined tip preparation by ele ...... e and atomic force microscope.
@ast
Refined tip preparation by ele ...... e and atomic force microscope.
@en
prefLabel
Refined tip preparation by ele ...... e and atomic force microscope.
@ast
Refined tip preparation by ele ...... e and atomic force microscope.
@en
P2093
P2860
P356
P1476
Refined tip preparation by ele ...... pe and atomic force microscope
@en
P2093
David Oliver
Mehdi El Ouali
Peter Grütter
Till Hagedorn
William Paul
P2860
P304
P356
10.1063/1.3660279
P407
P577
2011-11-01T00:00:00Z