Detection of Single-Electron Charging in an Individual InAs Quantum Dot by Noncontact Atomic-Force Microscopy
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Detection of Single-Electron Charging in an Individual InAs Quantum Dot by Noncontact Atomic-Force Microscopy
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im Februar 2005 veröffentlichter wissenschaftlicher Artikel
@de
scientific article published on 08 February 2005
@en
wetenschappelijk artikel
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наукова стаття, опублікована в лютому 2005
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name
Detection of Single-Electron C ...... ontact Atomic-Force Microscopy
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Detection of Single-Electron C ...... ontact Atomic-Force Microscopy
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type
label
Detection of Single-Electron C ...... ontact Atomic-Force Microscopy
@en
Detection of Single-Electron C ...... ontact Atomic-Force Microscopy
@nl
prefLabel
Detection of Single-Electron C ...... ontact Atomic-Force Microscopy
@en
Detection of Single-Electron C ...... ontact Atomic-Force Microscopy
@nl
P2093
P1476
Detection of single-electron c ...... ontact atomic-force microscopy
@en
P2093
Andy Sachrajda
Peter Grutter
Philip Poole
Qingfeng Sun
Romain Stomp
Sacha Schaer
Sergei Studenikin
P304
P356
10.1103/PHYSREVLETT.94.056802
P407
P577
2005-02-08T00:00:00Z
P698
P818
cond-mat/0501272