Fabrication and characterization of metal-molecule-metal junctions by conducting probe atomic force microscopy.
about
Surface analysis methods for characterizing polymeric biomaterials.Probing pi-coupling in molecular junctions.Molecular electronics: some views on transport junctions and beyondDistance-Dependent Measurements of the Conductance of Porphyrin Nanorods Studied with Conductive Probe Atomic Force MicroscopyPorphyrins as Molecular Electronic Components of Functional DevicesMeasuring localized redox enzyme electron transfer in a live cell with conducting atomic force microscopy.On the mechanical and electronic properties of thiolated gold nanocrystals.Nano-fabrication of molecular electronic junctions by targeted modification of metal-molecule bonds.Electrical detection of cancer biomarker using aptamers with nanogap break-junctions.Synthesis of one-molecule-thick single-crystalline nanosheets of energetic material for high-sensitive force sensorLong-range electron tunneling.Single molecule electronic devices.Vibrational spectroscopy as a probe of molecule-based devices.Review: Peptides and proteins wired into the electrical circuits: an SPM-based approach.Electrochemistry of nanoparticles.Cross-conjugation and quantum interference: a general correlation?Molecular electronic states near metal surfaces at equilibrium using potential of mean force and numerical renormalization group methods: Hysteresis revisited.Trace Detection of Metalloporphyrin-Based Coordination Polymer Particles via Modified Surface-Enhanced Raman Scattering Assisted by Surface Metallization.Mechanically and Electrically Robust Self-Assembled Monolayers for Large-Area Tunneling Junctions.Theoretical analysis of electron transport through organic molecules.Floppy molecules as candidates for achieving optoelectronic molecular devices without skeletal rearrangement or bond breaking.Conductive probe AFM study of Pt-thiol and Au-thiol contacts in metal-molecule-metal systems.Two-dimensional assembly and local redox-activity of molecular hybrid structures in an electrochemical environment.Metalloprotein tunnel junctions: compressional modulation of barrier height and transport mechanism.Energy level alignment at organic semiconductor/metal interfaces: effect of polar self-assembled monolayers at the interface.High surface coverage of a self-assembled monolayer by in situ synthesis of palladium nanodeposits.Crystallization and Polymorphism of Organic Semiconductor in Thin Film Induced by Surface Segregated Monolayers.α-Helicomimetic foldamers as electron transfer mediators.Electron transport in self-assembled polymer molecular junctions.Transition from direct tunneling to field emission in metal-molecule-metal junctions.Scanning Techniques for Nanobioconjugates of Carbon Nanotubes.Temperature-dependent molecular conduction measured by the electrochemical deposition of a platinum electrode in a lateral configurationImpact of adsorbed organic monolayers on vacuum electron tunneling contributions to electrical resistance at an asperity contactMultilevel conductance switching for a monolayer of redox-active metal complexes through various metallic contactsInteraction Potential between Parabolic Rotator and an Outside ParticleElectrostatic modification of novel materials
P2860
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P2860
Fabrication and characterization of metal-molecule-metal junctions by conducting probe atomic force microscopy.
description
2001 nî lūn-bûn
@nan
2001 թուականի Յունիսին հրատարակուած գիտական յօդուած
@hyw
2001 թվականի հունիսին հրատարակված գիտական հոդված
@hy
2001年の論文
@ja
2001年論文
@yue
2001年論文
@zh-hant
2001年論文
@zh-hk
2001年論文
@zh-mo
2001年論文
@zh-tw
2001年论文
@wuu
name
Fabrication and characterizati ...... probe atomic force microscopy.
@ast
Fabrication and characterizati ...... probe atomic force microscopy.
@en
type
label
Fabrication and characterizati ...... probe atomic force microscopy.
@ast
Fabrication and characterizati ...... probe atomic force microscopy.
@en
prefLabel
Fabrication and characterizati ...... probe atomic force microscopy.
@ast
Fabrication and characterizati ...... probe atomic force microscopy.
@en
P356
P1476
Fabrication and characterizati ...... probe atomic force microscopy.
@en
P2093
P304
P356
10.1021/JA0101532
P407
P577
2001-06-01T00:00:00Z