Effect of contact stiffness on wedge calibration of lateral force in atomic force microscopy.
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Calibration of lateral force measurements in atomic force microscopy with a piezoresistive force sensor.The extended wedge method: atomic force microscope friction calibration for improved tolerance to instrument misalignments, tip offset, and blunt probes.Correlation between frictional force and surface roughness of orthodontic archwires.
P2860
Effect of contact stiffness on wedge calibration of lateral force in atomic force microscopy.
description
2007 nî lūn-bûn
@nan
2007 թուականի Ապրիլին հրատարակուած գիտական յօդուած
@hyw
2007 թվականի ապրիլին հրատարակված գիտական հոդված
@hy
2007年の論文
@ja
2007年論文
@yue
2007年論文
@zh-hant
2007年論文
@zh-hk
2007年論文
@zh-mo
2007年論文
@zh-tw
2007年论文
@wuu
name
Effect of contact stiffness on ...... ce in atomic force microscopy.
@ast
Effect of contact stiffness on ...... ce in atomic force microscopy.
@en
type
label
Effect of contact stiffness on ...... ce in atomic force microscopy.
@ast
Effect of contact stiffness on ...... ce in atomic force microscopy.
@en
prefLabel
Effect of contact stiffness on ...... ce in atomic force microscopy.
@ast
Effect of contact stiffness on ...... ce in atomic force microscopy.
@en
P2860
P356
P1476
Effect of contact stiffness on ...... ce in atomic force microscopy.
@en
P2093
Xuezeng Zhao
P2860
P304
P356
10.1063/1.2720723
P407
P577
2007-04-01T00:00:00Z