Calibration of lateral force measurements in atomic force microscopy with a piezoresistive force sensor.
about
Characterizing piezoscanner hysteresis and creep using optical levers and a reference nanopositioning stage.The extended wedge method: atomic force microscope friction calibration for improved tolerance to instrument misalignments, tip offset, and blunt probes.Precise and direct method for the measurement of the torsion spring constant of the atomic force microscopy cantilevers.Experimental study and modeling of atomic-scale friction in zigzag and armchair lattice orientations of MoS2Optical lever calibration in atomic force microscope with a mechanical lever.
P2860
Calibration of lateral force measurements in atomic force microscopy with a piezoresistive force sensor.
description
2008 nî lūn-bûn
@nan
2008 թուականի Մարտին հրատարակուած գիտական յօդուած
@hyw
2008 թվականի մարտին հրատարակված գիտական հոդված
@hy
2008年の論文
@ja
2008年論文
@yue
2008年論文
@zh-hant
2008年論文
@zh-hk
2008年論文
@zh-mo
2008年論文
@zh-tw
2008年论文
@wuu
name
Calibration of lateral force m ...... a piezoresistive force sensor.
@ast
Calibration of lateral force m ...... a piezoresistive force sensor.
@en
Calibration of lateral force m ...... a piezoresistive force sensor.
@nl
type
label
Calibration of lateral force m ...... a piezoresistive force sensor.
@ast
Calibration of lateral force m ...... a piezoresistive force sensor.
@en
Calibration of lateral force m ...... a piezoresistive force sensor.
@nl
prefLabel
Calibration of lateral force m ...... a piezoresistive force sensor.
@ast
Calibration of lateral force m ...... a piezoresistive force sensor.
@en
Calibration of lateral force m ...... a piezoresistive force sensor.
@nl
P2093
P2860
P356
P1476
Calibration of lateral force m ...... a piezoresistive force sensor.
@en
P2093
Julien Vitard
Mehdi Boukallel
Stéphane Régnier
P2860
P304
P356
10.1063/1.2894209
P407
P50
P577
2008-03-01T00:00:00Z