Broadband dielectric microwave microscopy on micron length scales.
about
Disentangling time in a near-field approach to scanning probe microscopy.Probing resistivity and doping concentration of semiconductors at the nanoscale using scanning microwave microscopy.Nondestructive imaging of atomically thin nanostructures buried in silicon.Quantitative scanning near-field microwave microscopy for thin film dielectric constant measurement.Temperature dependence dynamical permeability characterization of magnetic thin film using near-field microwave microscopy.Imaging physical phenomena with local probes: From electrons to photons
P2860
Broadband dielectric microwave microscopy on micron length scales.
description
2007 nî lūn-bûn
@nan
2007 թուականի Ապրիլին հրատարակուած գիտական յօդուած
@hyw
2007 թվականի ապրիլին հրատարակված գիտական հոդված
@hy
2007年の論文
@ja
2007年論文
@yue
2007年論文
@zh-hant
2007年論文
@zh-hk
2007年論文
@zh-mo
2007年論文
@zh-tw
2007年论文
@wuu
name
Broadband dielectric microwave microscopy on micron length scales.
@ast
Broadband dielectric microwave microscopy on micron length scales.
@en
type
label
Broadband dielectric microwave microscopy on micron length scales.
@ast
Broadband dielectric microwave microscopy on micron length scales.
@en
prefLabel
Broadband dielectric microwave microscopy on micron length scales.
@ast
Broadband dielectric microwave microscopy on micron length scales.
@en
P356
P1476
Broadband dielectric microwave microscopy on micron length scales.
@en
P2093
John Melngailis
Zhengkun Ma
P304
P356
10.1063/1.2719613
P407
P577
2007-04-01T00:00:00Z
P5875
P698
P818
cond-mat/0702573