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Giant elastic tunability in strained BiFeO3 near an electrically induced phase transitionBig-data reflection high energy electron diffraction analysis for understanding epitaxial film growth processes.Local coexistence of VO2 phases revealed by deep data analysis.Broadband dielectric microwave microscopy on micron length scales.Seeing through Walls at the Nanoscale: Microwave Microscopy of Enclosed Objects and Processes in Liquids.Spatially-resolved mapping of history-dependent coupled electrochemical and electronical behaviors of electroresistive NiO.Selective growth of well-aligned semiconducting single-walled carbon nanotubes.Nanoscale lubrication of ionic surfaces controlled via a strong electric field.Kelvin probe force microscopy in liquid using electrochemical force microscopy.Surface Control of Epitaxial Manganite Films via Oxygen Pressure.Atomic-Level Sculpting of Crystalline Oxides: Toward Bulk Nanofabrication with Single Atomic Plane Precision.Polarization Control via He-Ion Beam Induced Nanofabrication in Layered Ferroelectric Semiconductors.Microwave a.c. conductivity of domain walls in ferroelectric thin filmsProbing local bias-induced transitions using photothermal excitation contact resonance atomic force microscopy and voltage spectroscopy.Quantification of surface displacements and electromechanical phenomena via dynamic atomic force microscopy.The Ehrlich-Schwoebel barrier on an oxide surface: a combined Monte-Carlo and in situ scanning tunneling microscopy approach.Ion transport and softening in a polymerized ionic liquid.Open loop Kelvin probe force microscopy with single and multi-frequency excitation.Spatially resolved mapping of oxygen reduction/evolution reaction on solid-oxide fuel cell cathodes with sub-10 nm resolution.Dimensionality Controlled Octahedral Symmetry-Mismatch and Functionalities in Epitaxial LaCoO₃/SrTiO₃ Heterostructures.An atomic force microscopy mode for nondestructive electromechanical studies and its application to diphenylalanine peptide nanotubes.Quantification of In-Contact Probe-Sample Electrostatic Forces with Dynamic Atomic Force Microscopy.Breaking the limits of structural and mechanical imaging of the heterogeneous structure of coal macerals.Magnetically induced field effect in carbon nanotube devices.Real space mapping of Li-ion transport in amorphous Si anodes with nanometer resolution.The role of electrochemical phenomena in scanning probe microscopy of ferroelectric thin films.Interplay of octahedral tilts and polar order in BiFeO3 films.Toward quantitative electrochemical measurements on the nanoscale by scanning probe microscopy: environmental and current spreading effects.Probing charge screening dynamics and electrochemical processes at the solid-liquid interface with electrochemical force microscopy.Humidity effect on nanoscale electrochemistry in solid silver ion conductors and the dual nature of its locality.Differentiating Ferroelectric and Nonferroelectric Electromechanical Effects with Scanning Probe Microscopy.Direct mapping of ionic transport in a Si anode on the nanoscale: time domain electrochemical strain spectroscopy studyNear-field microwave microscope with improved sensitivity and spatial resolutionHigh-resolution dielectric characterization of minerals: A step towards understanding the basic interactions between microwaves and rocksControlled Nanopatterning of a Polymerized Ionic Liquid in a Strong Electric FieldNanoscale Ferroelectricity in Crystalline γ-GlycineA self-forming nanocomposite concept for ZnO-based thermoelectricsDoping-Based Stabilization of the M2 Phase in Free-Standing VO2 Nanostructures at Room TemperatureInterplay between Ferroelastic and Metal−Insulator Phase Transitions in Strained Quasi-Two-Dimensional VO2NanoplateletsSymmetry Relationship and Strain-Induced Transitions between Insulating M1 and M2 and Metallic R phases of Vanadium Dioxide
P50
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P50
description
hulumtues
@sq
onderzoeker
@nl
researcher
@en
հետազոտող
@hy
name
Alexander Tselev
@ast
Alexander Tselev
@en
Alexander Tselev
@es
type
label
Alexander Tselev
@ast
Alexander Tselev
@en
Alexander Tselev
@es
prefLabel
Alexander Tselev
@ast
Alexander Tselev
@en
Alexander Tselev
@es
P108
P1053
L-8579-2015
P106
P1153
6603699027
P1960
9tPqSNAAAAAJ
P2038
Alexander_Tselev
P21
P31
P3829
P496
0000-0002-0098-6696