Lateral force microscope calibration using a modified atomic force microscope cantilever.
about
Quantitative comparison of two independent lateral force calibration techniques for the atomic force microscope.Atomic force microscope cantilever spring constant evaluation for higher mode oscillations: a kinetostatic method.Note: Lateral force microscope calibration using multiple location pivot loading of rectangular cantilevers.Correlation between frictional force and surface roughness of orthodontic archwires.Normal and Lateral Force Calibration Techniques for AFM Cantilevers
P2860
Lateral force microscope calibration using a modified atomic force microscope cantilever.
description
2007 nî lūn-bûn
@nan
2007 թուականի Հոկտեմբերին հրատարակուած գիտական յօդուած
@hyw
2007 թվականի հոտեմբերին հրատարակված գիտական հոդված
@hy
2007年の論文
@ja
2007年論文
@yue
2007年論文
@zh-hant
2007年論文
@zh-hk
2007年論文
@zh-mo
2007年論文
@zh-tw
2007年论文
@wuu
name
Lateral force microscope calibration using a modified atomic force microscope cantilever.
@ast
Lateral force microscope calibration using a modified atomic force microscope cantilever.
@en
Lateral force microscope calibration using a modified atomic force microscope cantilever.
@nl
type
label
Lateral force microscope calibration using a modified atomic force microscope cantilever.
@ast
Lateral force microscope calibration using a modified atomic force microscope cantilever.
@en
Lateral force microscope calibration using a modified atomic force microscope cantilever.
@nl
prefLabel
Lateral force microscope calibration using a modified atomic force microscope cantilever.
@ast
Lateral force microscope calibration using a modified atomic force microscope cantilever.
@en
Lateral force microscope calibration using a modified atomic force microscope cantilever.
@nl
P2860
P356
P1476
Lateral force microscope calibration using a modified atomic force microscope cantilever.
@en
P2093
Reitsma MG
P2860
P304
P356
10.1063/1.2789653
P407
P577
2007-10-01T00:00:00Z