about
Magneto-elasto-electroporation (MEEP): In-vitro visualization and numerical characteristics.Continuous laser-excited photothermal spectrometry of CdSxSe1-x doped glasses.Pulsed laser excited photothermal lens spectrometry of CdSxSe(1-x) doped silica glasses.Thermal diffusivity measurements of thin plates and filaments using lock-in thermography.Two-dimensional fringe probing of transient liquid temperatures in a mini space.Note: Focus error detection device for thermal expansion-recovery microscopy (ThERM).Nonlinear Midinfrared Photothermal Spectroscopy Using Zharov Splitting and Quantum Cascade Lasers.Local measurement of thermal conductivity and diffusivity.Depth-selective photothermal IR spectroscopy of skin: potential application for non-invasive glucose measurement.Contactless near-field scanning thermoreflectance imaging.Experimental quantification of useful and parasitic absorption of light in plasmon-enhanced thin silicon films for solar cells application.Colorimetric detection of DNA sequences based on electrostatic interactions with unmodified gold nanoparticles.Thermoreflectance temperature measurement with millimeter wave.Electronic Structure of Low-Temperature Solution-Processed Amorphous Metal Oxide Semiconductors for Thin-Film Transistor Applications.Study of the surface properties of ZnO nanocolumns used for thin-film solar cells.Two-dimensional carrier distribution in top-gate polymer field-effect transistors: correlation between width of density of localized states and Urbach energy.Non-destructive evaluation of UV pulse laser-induced damage performance of fused silica optics.Partial oxidation of the absorber layer reduces charge carrier recombination in antimony sulfide solar cells.Effects of the charge-transfer reorganization energy on the open-circuit voltage in small-molecular bilayer organic photovoltaic devices: comparison of the influence of deposition rates of the donor.Near-ir absorption in chemically vapor deposited a-SiNx:H films.Trace gas analysis from glazes by means of a compact photothermal deflection spectroscopy apparatus.Evidence for the intrinsic nature of light-induced defects in undoped a-Si:H.Using Ultralow Dosages of Electron Acceptor to Reveal the Early Stage Donor-Acceptor Electronic Interactions in Bulk Heterojunction BlendsThermal diffusivity measurements of sub-micron organic dye thin films using a high temperature superconductor bolometerNear infrared laser annealing of CdTe and in-situ measurement of the evolution of structural and optical propertiesMicrostructural and Electronic Origins of Open-Circuit Voltage Tuning in Organic Solar Cells Based on Ternary BlendsEffective Solution- and Vacuum-Processed n-Doping by Dimers of Benzimidazoline RadicalsThe Crucial Influence of Fullerene Phases on Photogeneration in Organic Bulk Heterojunction Solar CellsConfined organization of fullerene units along high polymer chainsHigh Mobility N-Type Transistors Based on Solution-Sheared Doped 6,13-Bis(triisopropylsilylethynyl)pentacene Thin FilmsOptical properties of α-SiC:H thin films grown by rf sputteringPhotothermal Deflection Spectroscopy for Ultra Trace Analysis of Cobalt and Copper IonsApplication of infrared Fourier transform spectroscopy to problems in conservation II. Photothermal beam deflectionSpin-coated planar SbS hybrid solar cells approaching 5% efficiencyOptical and Electrical Effects of p-typeμc-SiOx:H in Thin-Film Silicon Solar Cells on Various Front Textures
P2860
Q30374837-FB9B8639-2F63-4524-BA4A-ECCA8FE58AF9Q33314991-8FAB399E-2913-46EA-9C62-FE06F531EC6AQ33480367-573B2A46-E651-423D-99CB-930E2277C904Q33490755-B58E9E60-6011-4C0A-84A3-5FA28D44CFFCQ33922115-9F57CD39-E207-43B0-9B47-0DAC8B05A51CQ34578569-5CE2F3DB-1C1D-4AC4-A014-FDD24F03ABC3Q34732088-516BEE22-ACF3-423B-979C-965780A092FBQ35883268-7A850969-3F00-4E01-A47B-5045A2F39B49Q36252308-4CB44194-8CEF-4EA9-BE32-1445B1BBE812Q36301834-ACEC93E0-CDA1-43BD-B5CD-614A1E220FBBQ36645385-2DAB0050-9F80-4093-9A6B-2D00660897A8Q37557398-3899CCB6-0195-4C31-A058-D1A37B7D59B3Q39166386-73B866A1-7E71-47F6-9E50-CF6D10C4A5D6Q41708810-AE452F36-DF9A-49B4-8FDF-7E2F1F649406Q41862096-2022A802-41C2-4EA8-889D-4270489A04BAQ43004076-3A1E5CEA-2D42-46F2-8402-0F4BA727FFF2Q47095227-99E51FF4-264D-4CD1-832D-3CEA61A1A5B1Q48051814-EF36ABFF-8802-4235-BD6D-AAFCA0467191Q51364767-EA877E47-CD20-476D-A4A2-877EA6FA6BB5Q53715828-154A5FE9-B08D-4550-9848-424ACD44DE31Q54375239-01AEAC21-9412-4EF0-A04D-845CFE07C361Q54650136-3B4AA466-4E6A-4DB0-94FA-6B2DA02C0036Q57425937-E37DDA27-0596-41E0-BAE0-E578BEC84492Q57549159-1AFE5CFB-A3CF-45D5-9CEB-838D0DFE4621Q57563101-82519E16-014D-4CBC-A3D8-340EAB3E4832Q57563155-44941942-002D-4BF2-988A-E28F467FA84BQ57563170-D1A0EF09-60DC-4520-87A2-F138F08E0EAEQ57563189-985B660A-0535-476F-B0E2-9942A93117DEQ57563196-9D13255F-091F-4423-BB91-19453A28889AQ57563203-0AE9AEB7-8828-406C-811A-EA93A273B107Q57658402-2BE93490-8C11-441E-B64E-F4D6E5679C2EQ58128083-800B98B6-6E1C-4C10-BA2D-DCD08EAFFE17Q58506411-01CE80E9-2396-47B8-902B-239F456F9DF8Q58795068-BD45057A-1496-430E-99BF-6039E7123453Q59044833-F76AE2DA-F4FA-4C96-9B48-DFA64A553970
P2860
description
1981 nî lūn-bûn
@nan
1981 թուականի Ապրիլին հրատարակուած գիտական յօդուած
@hyw
1981 թվականի ապրիլին հրատարակված գիտական հոդված
@hy
1981年の論文
@ja
1981年論文
@yue
1981年論文
@zh-hant
1981年論文
@zh-hk
1981年論文
@zh-mo
1981年論文
@zh-tw
1981年论文
@wuu
name
Photothermal deflection spectroscopy and detection.
@ast
Photothermal deflection spectroscopy and detection.
@en
Photothermal deflection spectroscopy and detection.
@nl
type
label
Photothermal deflection spectroscopy and detection.
@ast
Photothermal deflection spectroscopy and detection.
@en
Photothermal deflection spectroscopy and detection.
@nl
prefLabel
Photothermal deflection spectroscopy and detection.
@ast
Photothermal deflection spectroscopy and detection.
@en
Photothermal deflection spectroscopy and detection.
@nl
P2093
P356
P1433
P1476
Photothermal deflection spectroscopy and detection.
@en
P2093
P304
P356
10.1364/AO.20.001333
P407
P577
1981-04-01T00:00:00Z