A tuning fork based wide range mechanical characterization tool with nanorobotic manipulators inside a scanning electron microscope.
about
Development of a quartz tuning-fork-based force sensor for measurements in the tens of nanoNewton force range during nanomanipulation experiments.Scanning thermal microscopy based on a quartz tuning fork and a micro-thermocouple in active mode (2ω method).Contributed Review: Quartz force sensing probes for micro-applications.Note: Wide band amplifier for quartz tuning fork sensors with digitally controlled stray capacitance compensation.Decoration of reduced graphene oxide by gold nanoparticles: an enhanced negative photoconductivity.
P2860
A tuning fork based wide range mechanical characterization tool with nanorobotic manipulators inside a scanning electron microscope.
description
2011 nî lūn-bûn
@nan
2011 թուականի Մարտին հրատարակուած գիտական յօդուած
@hyw
2011 թվականի մարտին հրատարակված գիտական հոդված
@hy
2011年の論文
@ja
2011年論文
@yue
2011年論文
@zh-hant
2011年論文
@zh-hk
2011年論文
@zh-mo
2011年論文
@zh-tw
2011年论文
@wuu
name
A tuning fork based wide range ...... scanning electron microscope.
@ast
A tuning fork based wide range ...... scanning electron microscope.
@en
type
label
A tuning fork based wide range ...... scanning electron microscope.
@ast
A tuning fork based wide range ...... scanning electron microscope.
@en
prefLabel
A tuning fork based wide range ...... scanning electron microscope.
@ast
A tuning fork based wide range ...... scanning electron microscope.
@en
P2093
P2860
P356
P1476
A tuning fork based wide range ...... scanning electron microscope.
@en
P2093
Gilgueng Hwang
Juan Camilo Acosta
Jérôme Polesel-Maris
Stéphane Régnier
P2860
P304
P356
10.1063/1.3541776
P407
P577
2011-03-01T00:00:00Z