Forces and frequency shifts in atomic-resolution dynamic-force microscopy
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Noncontact atomic force microscopy simulator with phase-locked-loop controlled frequency detection and excitationAdvances in atomic force microscopyMechanical Vertical Manipulation of Selected Single Atoms by Soft Nanoindentation Using Near Contact Atomic Force MicroscopyInverting dynamic force microscopy: from signals to time-resolved interaction forces.A low temperature scanning tunneling microscope for electronic and force spectroscopy.Hollow-pyramid based scanning near-field optical microscope coupled to femtosecond pulses: a tool for nonlinear optics at the nanoscale.A tuning fork based wide range mechanical characterization tool with nanorobotic manipulators inside a scanning electron microscope.Modification of a commercial atomic force microscopy for low-noise, high-resolution frequency-modulation imaging in liquid environment.Frequency function in atomic force microscopy applied to a liquid environment.Revealing the angular symmetry of chemical bonds by atomic force microscopy.Chemical structure imaging of a single molecule by atomic force microscopy at room temperatureDevelopment of a quartz tuning-fork-based force sensor for measurements in the tens of nanoNewton force range during nanomanipulation experiments.A subsurface add-on for standard atomic force microscopes.Switching through intermediate states seen in a single nickel nanorod by cantilever magnetometryMultifrequency AFM: from origins to convergence.NMR spectroscopy for thin films by magnetic resonance force microscopy.A Unified Picture of Cantilever Frequency-Shift Measurements of Magnetic Resonance.Single-molecule chemistry and physics explored by low-temperature scanning probe microscopy.Multiparametric imaging of biological systems by force-distance curve-based AFM.Imaging Water Thin Films in Ambient Conditions Using Atomic Force Microscopy.Combined frequency modulated atomic force microscopy and scanning tunneling microscopy detection for multi-tip scanning probe microscopy applications.Single cycle and transient force measurements in dynamic atomic force microscopy.Voltage preamplifier for extensional quartz sensors used in scanning force microscopy.Probing viscoelastic response of soft material surfaces at the nanoscale.Fast nanomechanical spectroscopy of soft matter.Analysis of dispersive interactions at polymer/TiAlN interfaces by means of dynamic force spectroscopy.Near-field deformation of a liquid interface by atomic force microscopy.Direct determination of the energy required to operate a single molecule switch.Growth kinetics of racemic heptahelicene-2-carboxylic acid nanowires on calcite (104).Single atomic contact adhesion and dissipation in dynamic force microscopy.Three-electrode self-actuating self-sensing quartz cantilever: design, analysis, and experimental verification.Damping mechanism in dynamic force microscopy.Substrate templating upon self-assembly of hydrogen-bonded molecular networks on an insulating surface.Accurate Extraction of Electrostatic Force by a Voltage-Pulse Force Spectroscopy.Molecularly clean ionic liquid/rubrene single-crystal interfaces revealed by frequency modulation atomic force microscopy.Single electron on a nanodot in a double-barrier tunneling structure observed by noncontact atomic-force spectroscopy.In situ self-assembled organic interface layers for the controlled growth of oligothiophene thin films on ferroelectric Pb(Zr(0.2)Ti(0.8))O3.High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning forkComparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonatorsFrequency-modulated atomic force microscopy operation by imaging at the frequency shift minimum: the dip-df mode
P2860
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P2860
Forces and frequency shifts in atomic-resolution dynamic-force microscopy
description
1997 nî lūn-bûn
@nan
1997 թուականի Դեկտեմբերին հրատարակուած գիտական յօդուած
@hyw
1997 թվականի դեկտեմբերին հրատարակված գիտական հոդված
@hy
1997年の論文
@ja
1997年論文
@yue
1997年論文
@zh-hant
1997年論文
@zh-hk
1997年論文
@zh-mo
1997年論文
@zh-tw
1997年论文
@wuu
name
Forces and frequency shifts in atomic-resolution dynamic-force microscopy
@ast
Forces and frequency shifts in atomic-resolution dynamic-force microscopy
@en
Forces and frequency shifts in atomic-resolution dynamic-force microscopy
@en-gb
type
label
Forces and frequency shifts in atomic-resolution dynamic-force microscopy
@ast
Forces and frequency shifts in atomic-resolution dynamic-force microscopy
@en
Forces and frequency shifts in atomic-resolution dynamic-force microscopy
@en-gb
prefLabel
Forces and frequency shifts in atomic-resolution dynamic-force microscopy
@ast
Forces and frequency shifts in atomic-resolution dynamic-force microscopy
@en
Forces and frequency shifts in atomic-resolution dynamic-force microscopy
@en-gb
P2860
P1433
P1476
Forces and frequency shifts in atomic-resolution dynamic-force microscopy
@en
P2093
Franz J. Giessibl
P2860
P304
16010-16015
P356
10.1103/PHYSREVB.56.16010
P407
P577
1997-12-01T00:00:00Z
1997-12-15T00:00:00Z