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Phantom Force Induced by Tunneling Current: A Characterization on Si(111)Two-dimensional electron liquid state at LaAlO 3 -SrTiO 3 interfacesPhotothermal excitation and laser Doppler velocimetry of higher cantilever vibration modes for dynamic atomic force microscopy in liquid.Frequency function in atomic force microscopy applied to a liquid environment.Revealing the angular symmetry of chemical bonds by atomic force microscopy.Surface structure. Subatomic resolution force microscopy reveals internal structure and adsorption sites of small iron clusters.The emergence of multifrequency force microscopy.Invited review article: combining scanning probe microscopy with optical spectroscopy for applications in biology and materials science.Quantitative biomolecular imaging by dynamic nanomechanical mapping.Unlocking higher harmonics in atomic force microscopy with gentle interactionsFabrication of [001]-oriented tungsten tips for high resolution scanning tunneling microscopy.Accurate, explicit formulae for higher harmonic force spectroscopy by frequency modulation-AFM.Local spectroscopy and atomic imaging of tunneling current, forces, and dissipation on graphite.Wideband low-noise optical beam deflection sensor with photothermal excitation for liquid-environment atomic force microscopy.Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonatorsRapid reconstruction of a strong nonlinear property by a multiple lock-in techniqueSystematic measurement of pentacene assembled on Cu(111) by bimodal dynamic force microscopy at room temperatureUltrasensitive detection of lateral atomic-scale interactions on graphite (0001) via bimodal dynamic force measurementsIdentifying passivated dynamic force microscopy tips on H:Si(100)Large negative electronic compressibility of LaAlO3-SrTiO3interfaces with ultrathin LaAlO3layersHigher-order eigenmodes of qPlus sensors for high resolution dynamic atomic force microscopyReal topography, atomic relaxations, and short-range chemical interactions in atomic force microscopy: The case of theα−Sn∕Si(111)−(3×3)R30°surface
P2860
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P2860
description
2004 nî lūn-bûn
@nan
2004 թուականի Յունիսին հրատարակուած գիտական յօդուած
@hyw
2004 թվականի հունիսին հրատարակված գիտական հոդված
@hy
2004年の論文
@ja
2004年論文
@yue
2004年論文
@zh-hant
2004年論文
@zh-hk
2004年論文
@zh-mo
2004年論文
@zh-tw
2004年论文
@wuu
name
Force microscopy with light-atom probes.
@ast
Force microscopy with light-atom probes.
@en
Force microscopy with light-atom probes.
@nl
type
label
Force microscopy with light-atom probes.
@ast
Force microscopy with light-atom probes.
@en
Force microscopy with light-atom probes.
@nl
prefLabel
Force microscopy with light-atom probes.
@ast
Force microscopy with light-atom probes.
@en
Force microscopy with light-atom probes.
@nl
P356
P1433
P1476
Force microscopy with light-atom probes.
@en
P2093
Stefan Hembacher
P304
P356
10.1126/SCIENCE.1099730
P407
P577
2004-06-10T00:00:00Z