Identifying passivated dynamic force microscopy tips on H:Si(100)
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Resolving Intra- and Inter-Molecular Structure with Non-Contact Atomic Force MicroscopyIndications of chemical bond contrast in AFM images of a hydrogen-terminated silicon surfaceMeasuring the reactivity of a silicon-terminated probeIntramolecular bonds resolved on a semiconductor surfaceDiscriminating short-range from van der Waals forces using total force data in noncontact atomic force microscopy
P2860
Identifying passivated dynamic force microscopy tips on H:Si(100)
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im Juni 2012 veröffentlichter wissenschaftlicher Artikel
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wetenschappelijk artikel
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наукова стаття, опублікована в червні 2012
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name
Identifying passivated dynamic force microscopy tips on H:Si
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Identifying passivated dynamic force microscopy tips on H:Si(100)
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type
label
Identifying passivated dynamic force microscopy tips on H:Si
@nl
Identifying passivated dynamic force microscopy tips on H:Si(100)
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prefLabel
Identifying passivated dynamic force microscopy tips on H:Si
@nl
Identifying passivated dynamic force microscopy tips on H:Si(100)
@en
P2093
P2860
P50
P356
P1476
Identifying passivated dynamic force microscopy tips on H:Si(100)
@en
P2093
Adam Sweetman
Peter Sharp
Richard Woolley
Sam Jarvis
P2860
P304
P356
10.1063/1.4726086
P407
P577
2012-06-04T00:00:00Z