Kelvin probe force microscopy in liquid using electrochemical force microscopy.
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Advanced atomic force microscopy techniques III.Full data acquisition in Kelvin Probe Force Microscopy: Mapping dynamic electric phenomena in real spaceSolid-state electrochemistry on the nanometer and atomic scales: the scanning probe microscopy approach.An attempt to correlate surface physics with chemical properties: molecular beam and Kelvin probe investigations of Ce1-xZrxO2 thin films.
P2860
Kelvin probe force microscopy in liquid using electrochemical force microscopy.
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2015 nî lūn-bûn
@nan
2015 թուականի Յունուարին հրատարակուած գիտական յօդուած
@hyw
2015 թվականի հունվարին հրատարակված գիտական հոդված
@hy
2015年の論文
@ja
2015年論文
@yue
2015年論文
@zh-hant
2015年論文
@zh-hk
2015年論文
@zh-mo
2015年論文
@zh-tw
2015年论文
@wuu
name
Kelvin probe force microscopy in liquid using electrochemical force microscopy.
@ast
Kelvin probe force microscopy in liquid using electrochemical force microscopy.
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type
label
Kelvin probe force microscopy in liquid using electrochemical force microscopy.
@ast
Kelvin probe force microscopy in liquid using electrochemical force microscopy.
@en
prefLabel
Kelvin probe force microscopy in liquid using electrochemical force microscopy.
@ast
Kelvin probe force microscopy in liquid using electrochemical force microscopy.
@en
P2093
P2860
P50
P356
P1476
Kelvin probe force microscopy in liquid using electrochemical force microscopy.
@en
P2093
Alexander Tselev
Brian J Rodriguez
Jason I Kilpatrick
Liam Collins
M Baris Okatan
Stephen Jesse
P2860
P304
P356
10.3762/BJNANO.6.19
P50
P577
2015-01-19T00:00:00Z