Sub-nanometre resolution imaging of polymer-fullerene photovoltaic blends using energy-filtered scanning electron microscopy.
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Bulk Heterojunction Morphologies with Atomistic Resolution from Coarse-Grain Solvent Evaporation SimulationsVirtual substrate method for nanomaterials characterizationQuantitative secondary electron imaging for work function extraction at atomic level and layer identification of grapheneBulk heterojunction morphology of polymer:fullerene blends revealed by ultrafast spectroscopyLight Harvesting for Organic PhotovoltaicsA composite light-harvesting layer from photoactive polymer and halide perovskite for planar heterojunction solar cells.Mapping Nanostructural Variations in Silk by Secondary Electron Hyperspectral Imaging.Polarized electron beams elastically scattered by atoms as a tool for testing fundamental predictions of quantum mechanics.Quantifying local thickness and composition in thin films of organic photovoltaic blends by Raman scattering
P2860
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P2860
Sub-nanometre resolution imaging of polymer-fullerene photovoltaic blends using energy-filtered scanning electron microscopy.
description
2015 nî lūn-bûn
@nan
2015年の論文
@ja
2015年論文
@yue
2015年論文
@zh-hant
2015年論文
@zh-hk
2015年論文
@zh-mo
2015年論文
@zh-tw
2015年论文
@wuu
2015年论文
@zh
2015年论文
@zh-cn
name
Sub-nanometre resolution imagi ...... scanning electron microscopy.
@ast
Sub-nanometre resolution imagi ...... scanning electron microscopy.
@en
type
label
Sub-nanometre resolution imagi ...... scanning electron microscopy.
@ast
Sub-nanometre resolution imagi ...... scanning electron microscopy.
@en
prefLabel
Sub-nanometre resolution imagi ...... scanning electron microscopy.
@ast
Sub-nanometre resolution imagi ...... scanning electron microscopy.
@en
P2093
P2860
P50
P356
P1476
Sub-nanometre resolution imagi ...... scanning electron microscopy.
@en
P2093
Athene M Donald
Fabian-Cyril Sasam
Maurizio Dapor
Tom S Glen
P2860
P2888
P356
10.1038/NCOMMS7928
P407
P577
2015-04-24T00:00:00Z