Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene
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Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene
description
2016 nî lūn-bûn
@nan
2016年の論文
@ja
2016年論文
@yue
2016年論文
@zh-hant
2016年論文
@zh-hk
2016年論文
@zh-mo
2016年論文
@zh-tw
2016年论文
@wuu
2016年论文
@zh
2016年论文
@zh-cn
name
Quantitative secondary electro ...... yer identification of graphene
@ast
Quantitative secondary electro ...... yer identification of graphene
@en
type
label
Quantitative secondary electro ...... yer identification of graphene
@ast
Quantitative secondary electro ...... yer identification of graphene
@en
prefLabel
Quantitative secondary electro ...... yer identification of graphene
@ast
Quantitative secondary electro ...... yer identification of graphene
@en
P2093
P2860
P50
P356
P1433
P1476
Quantitative secondary electro ...... yer identification of graphene
@en
P2093
Maurizio Dapor
Robert O'Connell
Yangbo Zhou
P2860
P2888
P356
10.1038/SREP21045
P407
P577
2016-02-16T00:00:00Z