Design of a hybrid double-sideband/single-sideband (schlieren) objective aperture suitable for electron microscopy.
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Invited review article: Methods for imaging weak-phase objects in electron microscopyMethods for testing Zernike phase plates and a report on silicon-based phase plates with reduced charging and improved ageing characteristics.Volta potential phase plate for in-focus phase contrast transmission electron microscopy.Minimizing electrostatic charging of an aperture used to produce in-focus phase contrast in the TEM.In-focus electrostatic Zach phase plate imaging for transmission electron microscopy with tunable phase contrast of frozen hydrated biological samples.
P2860
Design of a hybrid double-sideband/single-sideband (schlieren) objective aperture suitable for electron microscopy.
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2011 nî lūn-bûn
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2011年の論文
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2011年論文
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2011年論文
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2011年論文
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2011年論文
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2011年論文
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2011年论文
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2011年论文
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Design of a hybrid double-side ...... table for electron microscopy.
@ast
Design of a hybrid double-side ...... table for electron microscopy.
@en
type
label
Design of a hybrid double-side ...... table for electron microscopy.
@ast
Design of a hybrid double-side ...... table for electron microscopy.
@en
prefLabel
Design of a hybrid double-side ...... table for electron microscopy.
@ast
Design of a hybrid double-side ...... table for electron microscopy.
@en
P2093
P2860
P1433
P1476
Design of a hybrid double-side ...... table for electron microscopy.
@en
P2093
Andreas K Schmid
Bart Buijsse
Frank M H M van Laarhoven
Robert M Glaeser
Rossana Cambie
Stefano Cabrini
P2860
P304
P356
10.1016/J.ULTRAMIC.2011.09.015
P577
2011-10-04T00:00:00Z