Three-dimensional atomic force microscopy - taking surface imaging to the next level.
about
Flexible drift-compensation system for precise 3D force mapping in severe drift environments.Recent advances in submolecular resolution with scanning probe microscopy.High-speed atomic force microscope based on an astigmatic detection system.Effect of Ti:Sapphire-femtosecond laser on the surface roughness of ceramics.Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reductionRecent trends in surface characterization and chemistry with high-resolution scanning force methods.The emergence of multifrequency force microscopy.Influence of the adsorption geometry of PTCDA on Ag(111) on the tip-molecule forces in non-contact atomic force microscopyCoupled molecular and cantilever dynamics model for frequency-modulated atomic force microscopyInteraction imaging with amplitude-dependence force spectroscopy.Multichannel scanning probe microscopy and spectroscopy of graphene moiré structures.Enhanced atomic corrugation in dynamic force microscopy—The role of repulsive forcesThree-dimensional electrostatic interactions in dynamic force microscopy: Experiment and theoryImaging physical phenomena with local probes: From electrons to photonsThree-dimensional interaction force and tunneling current spectroscopy of point defects on rutile TiO2(110)Noncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material SurfacesAtom-specific forces and defect identification on surface-oxidized Cu(100) with combined 3D-AFM and STM measurementsDiscriminating short-range from van der Waals forces using total force data in noncontact atomic force microscopy
P2860
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P2860
Three-dimensional atomic force microscopy - taking surface imaging to the next level.
description
article científic
@ca
article scientifique
@fr
articolo scientifico
@it
artigo científico
@pt
bilimsel makale
@tr
scientific article published on July 2010
@en
vedecký článok
@sk
vetenskaplig artikel
@sv
videnskabelig artikel
@da
vědecký článek
@cs
name
Three-dimensional atomic force microscopy - taking surface imaging to the next level.
@en
Three-dimensional atomic force microscopy - taking surface imaging to the next level.
@nl
type
label
Three-dimensional atomic force microscopy - taking surface imaging to the next level.
@en
Three-dimensional atomic force microscopy - taking surface imaging to the next level.
@nl
prefLabel
Three-dimensional atomic force microscopy - taking surface imaging to the next level.
@en
Three-dimensional atomic force microscopy - taking surface imaging to the next level.
@nl
P2093
P356
P1433
P1476
Three-dimensional atomic force microscopy - taking surface imaging to the next level
@en
P2093
Eric I Altman
Todd C Schwendemann
Udo D Schwarz
P304
P356
10.1002/ADMA.200903909
P407
P577
2010-07-01T00:00:00Z