Recent trends in surface characterization and chemistry with high-resolution scanning force methods.
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Atomically resolved three-dimensional structures of electrolyte aqueous solutions near a solid surfaceFlexible drift-compensation system for precise 3D force mapping in severe drift environments.Kelvin probe force microscopy study of a Pt/TiO2 catalyst model placed in an atmospheric pressure of N2 environment.Defect mediated manipulation of nanoclusters on an insulator.An NC-AFM and KPFM study of the adsorption of a triphenylene derivative on KBr(001).Electrical Study of Trapped Charges in Copper-Doped Zinc Oxide Films by Scanning Probe Microscopy for Nonvolatile Memory ApplicationsVisualizing the Path of DNA through Proteins Using DREEM Imaging.Scanning force microscopy as applied to conformational studies in macromolecular research.New opportunities in crystal engineering--the role of atomic force microscopy in studies of molecular crystals.On-surface single molecule synthesis chemistry: a promising bottom-up approach towards functional surfaces.Reversible phase transformation at the solid-liquid interface: STM reveals.Tuning molecular self-assembly on bulk insulator surfaces by anchoring of the organic building blocks.Noise in NC-AFM measurements with significant tip-sample interactionOptimization of phase contrast in bimodal amplitude modulation AFM.Angstrom-Resolved Metal-Organic Framework-Liquid Interfaces.Atomic structures of silicene layers grown on Ag(111): scanning tunneling microscopy and noncontact atomic force microscopy observations.Noncontact atomic force microscopy study of the spinel MgAl(2)O(4)(111) surface.Models of the interaction of metal tips with insulating surfaces.Graphite, graphene on SiC, and graphene nanoribbons: Calculated images with a numerical FM-AFM.Room-temperature ice growth on graphite seeded by nano-graphene oxide.An energy-filtering device coupled to a quadrupole mass spectrometer for soft-landing molecular ions on surfaces with controlled energy.The local electronic properties of individual Pt atoms adsorbed on TiO2(110) studied by Kelvin probe force microscopy and first-principles simulations.CO tip functionalization in subatomic resolution atomic force microscopyFrequency-modulated atomic force microscopy operation by imaging at the frequency shift minimum: the dip-df modeEnergy Loss Triggered by Atomic-Scale Lateral ForceMeasuring Electric Field Induced Subpicometer Displacement of Step Edge IonsMultiscale approach for simulations of Kelvin probe force microscopy with atomic resolutionAtomic-scale dissipation processes in dynamic force spectroscopyResolving oxide surfaces - From point and line defects to complex network structuresAtom manipulation on an insulating surface at room temperatureMechanism of atomic force microscopy imaging of three-dimensional hydration structures at a solid-liquid interfaceAb initio Kinetic Monte Carlo simulations of dissolution at the NaCl–water interfaceNoncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material SurfacesAtom-specific forces and defect identification on surface-oxidized Cu(100) with combined 3D-AFM and STM measurementsAtom-resolved imaging of ordered defect superstructures at individual grain boundariesSurface Potential Analysis of Nanoscale Biomaterials and Devices Using Kelvin Probe Force MicroscopyInsights into Kelvin probe force microscopy data of insulator-supported moleculesDiscriminating short-range from van der Waals forces using total force data in noncontact atomic force microscopyIdentifying the absolute orientation of a low-symmetry surface in real space
P2860
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P2860
Recent trends in surface characterization and chemistry with high-resolution scanning force methods.
description
2010 nî lūn-bûn
@nan
2010年の論文
@ja
2010年学术文章
@wuu
2010年学术文章
@zh-cn
2010年学术文章
@zh-hans
2010年学术文章
@zh-my
2010年学术文章
@zh-sg
2010年學術文章
@yue
2010年學術文章
@zh
2010年學術文章
@zh-hant
name
Recent trends in surface chara ...... lution scanning force methods.
@en
Recent trends in surface chara ...... lution scanning force methods.
@nl
type
label
Recent trends in surface chara ...... lution scanning force methods.
@en
Recent trends in surface chara ...... lution scanning force methods.
@nl
prefLabel
Recent trends in surface chara ...... lution scanning force methods.
@en
Recent trends in surface chara ...... lution scanning force methods.
@nl
P2093
P2860
P356
P1433
P1476
Recent trends in surface chara ...... olution scanning force methods
@en
P2093
Adam S Foster
Alexander L Shluger
Claude R Henry
P2860
P304
P356
10.1002/ADMA.201002270
P407
P577
2010-11-11T00:00:00Z