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Measuring Electric Field Induced Subpicometer Displacement of Step Edge Ions

Measuring Electric Field Induced Subpicometer Displacement of Step Edge Ions

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Optimization of phase contrast in bimodal amplitude modulation AFM.Fast nanomechanical spectroscopy of soft matter.Energy Loss Triggered by Atomic-Scale Lateral Force Energy dissipation in dynamic force microscopy on KBr(001) correlated with atomic-scale adhesion phenomena

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Measuring Electric Field Induced Subpicometer Displacement of Step Edge Ions

http://www.wikidata.org/entity/Q57739292

description

article publié dans la revue scientifique Physical Review Letters

@fr

im Oktober 2012 veröffentlichter wissenschaftlicher Artikel

@de

scientific article published in Physical Review Letters

@en

wetenschappelijk artikel

@nl

наукова стаття, опублікована в жовтні 2012

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name

Measuring Electric Field Induced Subpicometer Displacement of Step Edge Ions

@en

Measuring Electric Field Induced Subpicometer Displacement of Step Edge Ions

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type

label

Measuring Electric Field Induced Subpicometer Displacement of Step Edge Ions

@en

Measuring Electric Field Induced Subpicometer Displacement of Step Edge Ions

@nl

prefLabel

Measuring Electric Field Induced Subpicometer Displacement of Step Edge Ions

@en

Measuring Electric Field Induced Subpicometer Displacement of Step Edge Ions

@nl

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PHYSREVLETT.109.146101

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Physical Review Letters

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Measuring electric field induced subpicometer displacement of step edge ions

@en

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Adam S Foster

http://www.w3.org/2001/XMLSchema#string

Filippo Federici Canova

http://www.w3.org/2001/XMLSchema#string

Teemu Hynninen

http://www.w3.org/2001/XMLSchema#string

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Advances in atomic force microscopy

Quantitative measurement of short-range chemical bonding forces.

The force needed to move an atom on a surface.

An atomic force microscope tip designed to measure time-varying nanomechanical forces.

Three-dimensional imaging of short-range chemical forces with picometre resolution.

Direct measurement of the attractive interaction forces on F0 color centers on MgO(001) by dynamic force microscopy.

Functionalized truxenes: adsorption and diffusion of single molecules on the KBr(001) surface.

Recent trends in surface characterization and chemistry with high-resolution scanning force methods.

Nanoscale engineering of molecular porphyrin wires on insulating surfaces.

Reversible bond formation in a gold-atom-organic-molecule complex as a molecular switch.

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146101

http://www.w3.org/2001/XMLSchema#string

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scholarly article

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10.1103/PHYSREVLETT.109.146101

http://www.w3.org/2001/XMLSchema#string

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14

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109

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2012-10-03T00:00:00Z

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23083258

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