Probing and Manipulating the Interfacial Defects of InGaAs Dual-Layer Metal Oxides at the Atomic Scale.
about
Probing and Manipulating the Interfacial Defects of InGaAs Dual-Layer Metal Oxides at the Atomic Scale.
description
2017 nî lūn-bûn
@nan
2017年の論文
@ja
2017年学术文章
@wuu
2017年学术文章
@zh
2017年学术文章
@zh-cn
2017年学术文章
@zh-hans
2017年学术文章
@zh-my
2017年学术文章
@zh-sg
2017年學術文章
@yue
2017年學術文章
@zh-hant
name
Probing and Manipulating the I ...... al Oxides at the Atomic Scale.
@en
Probing and Manipulating the I ...... al Oxides at the Atomic Scale.
@nl
type
label
Probing and Manipulating the I ...... al Oxides at the Atomic Scale.
@en
Probing and Manipulating the I ...... al Oxides at the Atomic Scale.
@nl
prefLabel
Probing and Manipulating the I ...... al Oxides at the Atomic Scale.
@en
Probing and Manipulating the I ...... al Oxides at the Atomic Scale.
@nl
P2093
P2860
P356
P1433
P1476
Probing and Manipulating the I ...... al Oxides at the Atomic Scale.
@en
P2093
Chaolun Wang
Gennadi Bersuker
Jian Zhang
Kinleong Pey
Runsheng Wang
P2860
P356
10.1002/ADMA.201703025
P407
P577
2017-11-27T00:00:00Z