Conductive Atomic Force Microscope Study of Bipolar and Threshold Resistive Switching in 2D Hexagonal Boron Nitride Films.
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Conductive Atomic Force Microscope Study of Bipolar and Threshold Resistive Switching in 2D Hexagonal Boron Nitride Films.
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2018 nî lūn-bûn
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2018年の論文
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2018年学术文章
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2018年学术文章
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2018年学术文章
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name
Conductive Atomic Force Micros ...... Hexagonal Boron Nitride Films.
@en
Conductive Atomic Force Micros ...... Hexagonal Boron Nitride Films.
@nl
type
label
Conductive Atomic Force Micros ...... Hexagonal Boron Nitride Films.
@en
Conductive Atomic Force Micros ...... Hexagonal Boron Nitride Films.
@nl
prefLabel
Conductive Atomic Force Micros ...... Hexagonal Boron Nitride Films.
@en
Conductive Atomic Force Micros ...... Hexagonal Boron Nitride Films.
@nl
P2093
P2860
P1433
P1476
Conductive Atomic Force Micros ...... Hexagonal Boron Nitride Films
@en
P2093
P2860
P356
10.1038/S41598-018-21138-X
P407
P577
2018-02-12T00:00:00Z