Manipulation of single atoms by atomic force microscopy as a resonance effect.

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Manipulation of gold colloidal nanoparticles with atomic force microscopy in dynamic mode: influence of particle-substrate chemistry and morphology, and of operating conditions.An interaction stress analysis of nanoscale elastic asperity contacts.

P2860

Q35140647-4B3D7BC4-C94F-4AC1-9498-0C644CA6B721 Q44124431-D90B4565-C446-4F27-99A7-B95F514AD981

P2860

Manipulation of single atoms by atomic force microscopy as a resonance effect.

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http://www.wikidata.org/entity/Q51821295

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2009 nî lūn-bûn

@nan

2009年の論文

@ja

2009年学术文章

@wuu

2009年学术文章

@zh

2009年学术文章

@zh-cn

2009年学术文章

@zh-hans

2009年学术文章

@zh-my

2009年学术文章

@zh-sg

2009年學術文章

@yue

2009年學術文章

@zh-hant

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Manipulation of single atoms by atomic force microscopy as a resonance effect.

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Manipulation of single atoms by atomic force microscopy as a resonance effect.

@nl

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Item

label

Manipulation of single atoms by atomic force microscopy as a resonance effect.

@en

Manipulation of single atoms by atomic force microscopy as a resonance effect.

@nl

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Manipulation of single atoms by atomic force microscopy as a resonance effect.

@en

Manipulation of single atoms by atomic force microscopy as a resonance effect.

@nl

P1476

Manipulation of single atoms by atomic force microscopy as a resonance effect.

@en

P2093

Byungsoo Kim

http://www.w3.org/2001/XMLSchema#string

Vakhtang Putkaradze

http://www.w3.org/2001/XMLSchema#string

P2860

Mechanical Vertical Manipulation of Selected Single Atoms by Soft Nanoindentation Using Near Contact Atomic Force Microscopy

Controlling the dynamics of a single atom in lateral atom manipulation.

Characteristics of fracture during the approach process and wear mechanism of a silicon AFM tip.

Chemical identification of individual surface atoms by atomic force microscopy.

Complex patterning by vertical interchange atom manipulation using atomic force microscopy.

Nanofabrication with atomic force microscopy.

Desorption of H from Si(111) by resonant excitation of the Si-H vibrational stretch mode.

Single atomic contact adhesion and dissipation in dynamic force microscopy.

Parametric resonance based scanning probe microscopy

Positioning single atoms with a scanning tunnelling microscope

P304

215502

http://www.w3.org/2001/XMLSchema#string

P31

scholarly article

P356

10.1103/PHYSREVLETT.102.215502

http://www.w3.org/2001/XMLSchema#string

P407

English

P433

http://www.w3.org/2001/XMLSchema#string

P478

102

http://www.w3.org/2001/XMLSchema#string

P50

Takashi Hikihara

P577

2009-05-27T00:00:00Z

http://www.w3.org/2001/XMLSchema#dateTime

P698

19519114

http://www.w3.org/2001/XMLSchema#string

Manipulation of single atoms by atomic force microscopy as a resonance effect.

about

P2860

P2860

Manipulation of single atoms by atomic force microscopy as a resonance effect.

description

name

type

label

prefLabel

P1433

P1476

P2093

P2860

P304

P31

P356

P407

P433

P478

P50

P577

P698

P356

P1433

P1476

P2093

P2860

P304

P31

P356

P407

P433

P478

P50

P577

P698