Chemical identification of individual surface atoms by atomic force microscopy.
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Resolving Intra- and Inter-Molecular Structure with Non-Contact Atomic Force MicroscopyAdvanced scanning probe lithographyTip-sample interactions on graphite studied using the wavelet transform.Imaging and three-dimensional reconstruction of chemical groups inside a protein complex using atomic force microscopy.Flexible drift-compensation system for precise 3D force mapping in severe drift environments.Study of thermal and acoustic noise interferences in low stiffness atomic force microscope cantilevers and characterization of their dynamic properties.A low temperature scanning tunneling microscope for electronic and force spectroscopy.Measuring the charge state of an adatom with noncontact atomic force microscopy.Direct quantitative measurement of the C═O⋅⋅⋅H-C bond by atomic force microscopy.Recent advances in submolecular resolution with scanning probe microscopy.Cold-atom scanning probe microscopy.Switching adhesion forces by crossing the metal-insulator transition in Magnéli-type vanadium oxide crystals.Development of method for evaluating cell hardness and correlation between bacterial spore hardness and durabilityBond-order discrimination by atomic force microscopy.Identifying tips for intramolecular NC-AFM imaging via in situ fingerprinting.Quantifying the atomic-level mechanics of single long physisorbed molecular chains.Atomic force microscopy study of the conformational change in immobilized calmodulin.Mechanical gate control for atom-by-atom cluster assembly with scanning probe microscopy.Artesunate altered cellular mechanical properties leading to deregulation of cell proliferation and migration in esophageal squamous cell carcinoma.Atomic species identification at the (101) anatase surface by simultaneous scanning tunnelling and atomic force microscopyIn situ fabrication and investigation of nanostructures and nanodevices with a microscope.Van der Waals interactions and the limits of isolated atom models at interfacesA simple method for the determination of qPlus sensor spring constants.The Mendeleev-Meyer force project.3D multi-energy deconvolution electron microscopy.Probing three-dimensional surface force fields with atomic resolution: Measurement strategies, limitations, and artifact reductionMultifrequency AFM: from origins to convergence.Detection and characterization of engineered nanoparticles in food and the environment.Recent trends in surface characterization and chemistry with high-resolution scanning force methods.Electrons, photons, and force: quantitative single-molecule measurements from physics to biology.Single-molecule chemistry and physics explored by low-temperature scanning probe microscopy.Invited review article: combining scanning probe microscopy with optical spectroscopy for applications in biology and materials science.Rapid quantitative chemical mapping of surfaces with sub-2 nm resolution.Impact of thermal frequency drift on highest precision force microscopy using quartz-based force sensors at low temperatures.Calibration of quartz tuning fork spring constants for non-contact atomic force microscopy: direct mechanical measurements and simulations.Synthesis, structure, and opto-electronic properties of organic-based nanoscale heterojunctions.Surface point defects on bulk oxides: atomically-resolved scanning probe microscopy.Single cycle and transient force measurements in dynamic atomic force microscopy.An automatic method for atom identification in scanning tunnelling microscopy images of Fe-chalcogenide superconductors.Sensing Noncollinear Magnetism at the Atomic Scale Combining Magnetic Exchange and Spin-Polarized Imaging.
P2860
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P2860
Chemical identification of individual surface atoms by atomic force microscopy.
description
2007 nî lūn-bûn
@nan
2007 թուականի Մարտին հրատարակուած գիտական յօդուած
@hyw
2007 թվականի մարտին հրատարակված գիտական հոդված
@hy
2007年の論文
@ja
2007年論文
@yue
2007年論文
@zh-hant
2007年論文
@zh-hk
2007年論文
@zh-mo
2007年論文
@zh-tw
2007年论文
@wuu
name
Chemical identification of individual surface atoms by atomic force microscopy.
@ast
Chemical identification of individual surface atoms by atomic force microscopy.
@en
Chemical identification of individual surface atoms by atomic force microscopy.
@nl
type
label
Chemical identification of individual surface atoms by atomic force microscopy.
@ast
Chemical identification of individual surface atoms by atomic force microscopy.
@en
Chemical identification of individual surface atoms by atomic force microscopy.
@nl
prefLabel
Chemical identification of individual surface atoms by atomic force microscopy.
@ast
Chemical identification of individual surface atoms by atomic force microscopy.
@en
Chemical identification of individual surface atoms by atomic force microscopy.
@nl
P2093
P50
P356
P1433
P1476
Chemical identification of individual surface atoms by atomic force microscopy.
@en
P2093
Masayuki Abe
Seizo Morita
Yoshiaki Sugimoto
P2888
P356
10.1038/NATURE05530
P407
P577
2007-03-01T00:00:00Z
P5875
P6179
1009050193