Contact resistance in metal-molecule-metal junctions based on aliphatic SAMs: effects of surface linker and metal work function.
about
Interfacial bridge-mediated electron transfer: mechanistic analysis based on electrochemical kinetics and theoretical modelling.A study of enhanced ion formation from metal-semiconductor complexes in atmospheric pressure laser desorption/ionization mass spectrometry.Single molecule electronic devices.Gold nanocrystal arrays as a macroscopic platform for molecular junction thermoelectrics.Mechanically and Electrically Robust Self-Assembled Monolayers for Large-Area Tunneling Junctions.Polarizabilities of adsorbed and assembled molecules: measuring the conductance through buried contacts.Electrical characterization of single molecule and Langmuir-Blodgett monomolecular films of a pyridine-terminated oligo(phenylene-ethynylene) derivative.Controlling the structural and electrical properties of diacid oligo(phenylene ethynylene) Langmuir-Blodgett films.Visible light driven plasmonic photochemistry on nano-textured silver.Metalloprotein tunnel junctions: compressional modulation of barrier height and transport mechanism.Universal scaling of the charge transport in large-area molecular junctions.The study of charge transport through organic thin films: mechanism, tools and applications.Transition from direct tunneling to field emission in metal-molecule-metal junctions.Structure Matters: Correlating temperature dependent electrical transport through alkyl monolayers with vibrational and photoelectron spectroscopiesMolecular Heterojunctions of Oligo(phenylene ethynylene)s with Linear to Cruciform FrameworkInfluence of metal-molecule contacts on decay coefficients and specific contact resistances in molecular junctions
P2860
Q33270017-60769C2A-4B08-41DA-941F-123ACED375E4Q33469266-02141409-0A0B-4095-A896-0289517E1E0BQ37835194-51B34BAD-5778-4DCB-A05E-037B8513658FQ40254979-1EDCC469-0840-4609-B59B-F52F74E5599FQ41026146-0DCADA58-E531-466D-829A-CB50288FB78FQ41493836-71F1A2A6-1A63-481F-B0F2-60EDCE8A689CQ41845767-48B856CC-527A-48DA-BCF0-81C86659BDA6Q46063430-E810789F-44CD-494F-9622-A4A19F78906CQ46249065-F70D7FC7-7D95-43D0-8FEE-CB2CA2E66019Q47347482-735F7E0C-953C-4545-B706-7845F55A5F51Q51572792-F43E4CF8-52D4-4065-BC6C-0D1273EC29CCQ51917447-D4674E43-8540-4A13-B609-EB859C667CD0Q53008614-45AF6AF9-E134-430C-9588-D66397E8A4D3Q57760371-C28A3B0C-A0C3-4AC0-8245-D82716C4EEF6Q57909588-61375BAC-1EA1-41E2-9647-0E86913096BCQ57923704-66E94251-6A20-4BC5-A218-C39BC6239EEE
P2860
Contact resistance in metal-molecule-metal junctions based on aliphatic SAMs: effects of surface linker and metal work function.
description
2002 nî lūn-bûn
@nan
2002年の論文
@ja
2002年学术文章
@wuu
2002年学术文章
@zh
2002年学术文章
@zh-cn
2002年学术文章
@zh-hans
2002年学术文章
@zh-my
2002年学术文章
@zh-sg
2002年學術文章
@yue
2002年學術文章
@zh-hant
name
Contact resistance in metal-mo ...... inker and metal work function.
@en
Contact resistance in metal-mo ...... inker and metal work function.
@nl
type
label
Contact resistance in metal-mo ...... inker and metal work function.
@en
Contact resistance in metal-mo ...... inker and metal work function.
@nl
prefLabel
Contact resistance in metal-mo ...... inker and metal work function.
@en
Contact resistance in metal-mo ...... inker and metal work function.
@nl
P2093
P356
P1476
Contact resistance in metal-mo ...... inker and metal work function.
@en
P2093
C Daniel Frisbie
Jeremy M Beebe
Larry L Miller
Vincent B Engelkes
P304
11268-11269
P356
10.1021/JA0268332
P407
P577
2002-09-01T00:00:00Z