Secondary electron emission in the scanning electron microscope
about
Focused, Nanoscale Electron-Beam-Induced Deposition and EtchingDynamical backaction cooling with free electrons.Collection of secondary electrons in scanning electron microscopes.Union operation image processing of data cubes separately processed by different objective filters and its application to void analysis in an all-solid-state lithium-ion battery.New technique for in-situ measurement of backscattered and secondary electron yields for the calculation of signal-to-noise ratio in a SEM.High-resolution, high-throughput imaging with a multibeam scanning electron microscopeSub-nanometre resolution imaging of polymer-fullerene photovoltaic blends using energy-filtered scanning electron microscopy.Simultaneous Scanning Electron Microscope Imaging of Topographical and Chemical Contrast Using In-Lens, In-Column, and Everhart-Thornley Detector Systems.Recent developments and new strategies in scanning electron microscopy.A systematic investigation of the charging effect in scanning electron microscopy for metal nanostructures on insulating substrates.3D multi-energy deconvolution electron microscopy.Visualization of carrier dynamics in p(n)-type GaAs by scanning ultrafast electron microscopy.Secondary Electron Emission Materials for Transmission Dynodes in Novel Photomultipliers: A Review.Information or resolution: Which is required from an SEM to study bulk inorganic materials?Note: measuring effects of Ar-ion cleaning on the secondary electron yield of copper due to electron impact.Novel approach to the semi-empirical universal theory for secondary electron yield.Note: A simple charge neutralization method for measuring the secondary electron yield of insulators.Noise coefficients of backscattered electron detectors for low voltage scanning electron microscopy.Catalytic subsurface etching of nanoscale channels in graphite.Comparative study of image contrast in scanning electron microscope and helium ion microscope.Micromagnetics of domain walls at surfaces.Cluster secondary ion mass spectrometry imaging of interfacial reactions of TiO2 microspheres embedded in ionic liquids.Quantifying the structural integrity of nanorod arrays.An integrated time-of-flight versus residual energy subsystem for a compact dual ion composition experiment for space plasmas.Thirty per cent contrast in secondary-electron imaging by scanning field-emission microscopy.Ultrathin high-temperature oxidation-resistant coatings of hexagonal boron nitrideWork function of few layer graphene covered nickel thin films measured with Kelvin probe force microscopyHelium, Oxygen, Proton, and Electron (HOPE) Mass Spectrometer for the Radiation Belt Storm Probes Mission
P2860
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P2860
Secondary electron emission in the scanning electron microscope
description
article
@en
im November 1983 veröffentlichter wissenschaftlicher Artikel
@de
wetenschappelijk artikel
@nl
наукова стаття, опублікована в листопаді 1983
@uk
ലേഖനം
@ml
name
Secondary electron emission in the scanning electron microscope
@en
Secondary electron emission in the scanning electron microscope
@nl
type
label
Secondary electron emission in the scanning electron microscope
@en
Secondary electron emission in the scanning electron microscope
@nl
prefLabel
Secondary electron emission in the scanning electron microscope
@en
Secondary electron emission in the scanning electron microscope
@nl
P2860
P356
P1476
Secondary electron emission in the scanning electron microscope
@en
P2093
P2860
P304
P356
10.1063/1.332840
P577
1983-11-01T00:00:00Z