about
Crack propagation and fracture in silicon wafers under thermal stressCitrate-capped gold nanoparticle electrophoretic heat production in response to a time-varying radiofrequency electric-field.Soft x-ray spectroscopic investigation of Zn doped CuCl produced by pulsed dc magnetron sputtering.Local strain and defects in silicon wafers due to nanoindentation revealed by full-field X-ray microdiffraction imaging.White beam topography of 300 mm Si wafersLow Temperature Growth GaAs on GeInfluence of substrate metal alloy type on the properties of hydroxyapatite coatings deposited using a novel ambient temperature deposition techniqueTechniques: 3D imaging of crystal defects
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Q30544547-BD0D7FED-C178-4213-93AE-6247AE52C2D7Q39398019-C7A5F43E-BDA8-41E6-BF88-CA28B70929D2Q45245948-46E7ACAC-7349-41A1-94B6-F0B8627D8FC6Q53192803-228181CA-1CAD-404A-83EE-42F9BA3BBC04Q53529656-559A3961-2C64-453F-940B-2F471B91F764Q57390550-A2B130EF-DF9A-4BAF-AD13-E0C353F7736EQ60477290-B7158EF4-7A76-485F-B8F2-C50C553DB0D7Q86498908-0EF09327-7D66-42B7-9757-EA5785A8C6F4
P50
description
researcher
@en
wetenschapper
@nl
հետազոտող
@hy
name
P. McNally
@ast
P. McNally
@nl
Patrick J. McNally
@en
Patrick J. McNally
@es
type
label
P. McNally
@ast
P. McNally
@nl
Patrick J. McNally
@en
Patrick J. McNally
@es
altLabel
Patrick McNally
@en
prefLabel
P. McNally
@ast
P. McNally
@nl
Patrick J. McNally
@en
Patrick J. McNally
@es
P214
P106
P1153
7102317773
P214
P2798
P31
P496
0000-0003-2798-5121