about
Crack propagation and fracture in silicon wafers under thermal stressColor-coordinate system from a 13th-century account of rainbows.Nondestructive X-ray diffraction measurement of warpage in silicon dies embedded in integrated circuit packages.Cracks observed to propagate discontinuously on the millisecond timescale.Bow-shaped caustics from conical prisms: a 13th-century account of rainbow formation from Robert Grosseteste's De iride.The relationship between interface structure, conformality and perpendicular anisotropy in CoPd multilayers.History: A medieval multiverse
P50
Q30544547-7C4487C2-5A5E-4F0A-8005-DC8AEEB00DD4Q30634384-C1D72A39-EEFC-407A-B6E7-838CEF278655Q37734693-6C475C57-C6DA-4098-B346-CBE6F7F3DE78Q38728065-4F10351C-FAAA-421E-94BF-7443F5A029E9Q47168337-A48B66E5-D44E-4CA7-AC8A-69F6D531BE0BQ54579732-21AA451A-55C8-42CB-9F17-CCAC7A82D13BQ59443898-650163D4-792B-4B07-B723-575C62E7DA64
P50
description
natuurkundige
@nl
researcher
@en
ricercatore
@it
հետազոտող
@hy
name
Brian K Tanner
@en
Brian K Tanner
@es
Brian K Tanner
@nl
Brian K. Tanner
@de
type
label
Brian K Tanner
@en
Brian K Tanner
@es
Brian K Tanner
@nl
Brian K. Tanner
@de
prefLabel
Brian K Tanner
@en
Brian K Tanner
@es
Brian K Tanner
@nl
Brian K. Tanner
@de
P227
P1153
7102303518
P21
P214
7075153954879805680004
P227
1080064087
P31
P496
0000-0002-1474-177X
P569
1947-01-01T00:00:00Z
P734
P735
P7859
viaf-7075153954879805680004