Near-field microwave microscope with improved sensitivity and spatial resolution
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Modeling and characterization of a cantilever-based near-field scanning microwave impedance microscope.Tapping mode microwave impedance microscopy.Cryogenic microwave imaging of metal-insulator transition in doped silicon.Nano-optical imaging and spectroscopy of order, phases, and domains in complex solids
P2860
Near-field microwave microscope with improved sensitivity and spatial resolution
description
article
@en
im Juni 2003 veröffentlichter wissenschaftlicher Artikel
@de
wetenschappelijk artikel
@nl
наукова стаття, опублікована в червні 2003
@uk
name
Near-field microwave microscope with improved sensitivity and spatial resolution
@en
Near-field microwave microscope with improved sensitivity and spatial resolution
@nl
type
label
Near-field microwave microscope with improved sensitivity and spatial resolution
@en
Near-field microwave microscope with improved sensitivity and spatial resolution
@nl
prefLabel
Near-field microwave microscope with improved sensitivity and spatial resolution
@en
Near-field microwave microscope with improved sensitivity and spatial resolution
@nl
P2093
P356
P1476
Near-field microwave microscope with improved sensitivity and spatial resolution
@en
P2093
Andrew R. Schwartz
Hans M. Christen
Robert L. Moreland
Vladimir V. Talanov
P304
P356
10.1063/1.1571954
P577
2003-06-01T00:00:00Z