Role of orbital overlap in atomic manipulation

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Resolving Intra- and Inter-Molecular Structure with Non-Contact Atomic Force Microscopy Identifying tips for intramolecular NC-AFM imaging via in situ fingerprinting.Complex design of dissipation signals in non-contact atomic force microscopy.Intramolecular bonds resolved on a semiconductor surface

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Q26797348-F86B5AD7-9325-4D2F-AA81-C23C9E355FDF Q34366157-CD51282E-AEBE-45C1-8BF7-492D8382C387 Q49056239-FAC27256-7226-4F3F-9012-B96C2C9632B7 Q58086783-DB2A87E5-9B74-4E7B-A499-ACAD615CE20A

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Role of orbital overlap in atomic manipulation

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http://www.wikidata.org/entity/Q58086909

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im Juni 2012 veröffentlichter wissenschaftlicher Artikel

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wetenschappelijk artikel

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наукова стаття, опублікована в червні 2012

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Role of orbital overlap in atomic manipulation

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Role of orbital overlap in atomic manipulation

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Role of orbital overlap in atomic manipulation

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Role of orbital overlap in atomic manipulation

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Role of orbital overlap in atomic manipulation

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Role of orbital overlap in atomic manipulation

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P1476

Role of orbital overlap in atomic manipulation

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P2093

Adam Sweetman

http://www.w3.org/2001/XMLSchema#string

Joseph Bamidele

http://www.w3.org/2001/XMLSchema#string

Lev Kantorovich

http://www.w3.org/2001/XMLSchema#string

Philip Moriarty

http://www.w3.org/2001/XMLSchema#string

Sam Jarvis

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P2860

Manipulating Si(100) at 5 K using qPlus frequency modulated atomic force microscopy: Role of defects and dynamics in the mechanical switching of atoms

Mechanical Vertical Manipulation of Selected Single Atoms by Soft Nanoindentation Using Near Contact Atomic Force Microscopy

The chemical structure of a molecule resolved by atomic force microscopy

Atomic resolution of the silicon (111)-(7x7) surface by atomic force microscopy.

The force needed to move an atom on a surface.

Complex patterning by vertical interchange atom manipulation using atomic force microscopy.

Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe.

Mechanism for room-temperature single-atom lateral manipulations on semiconductors using dynamic force microscopy.

Origin of p(2 x 1) phase on Si(001) by noncontact atomic force microscopy at 5 k.

Single atomic contact adhesion and dissipation in dynamic force microscopy.

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scholarly article

P356

10.1103/PHYSREVB.85.235305

http://www.w3.org/2001/XMLSchema#string

P407

English

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http://www.w3.org/2001/XMLSchema#string

P478

http://www.w3.org/2001/XMLSchema#string

P577

2012-06-07T00:00:00Z

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Role of orbital overlap in atomic manipulation

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P2860

P2860

Role of orbital overlap in atomic manipulation

description

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type

label

prefLabel

P1433

P1476

P2093

P2860

P31

P356

P407

P433

P478

P577

P356

P1433

P1476

P2093

P2860

P31

P356

P407

P433

P478

P577