Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe.
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Calculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensorCritical assessment of the evidence for striped nanoparticlesAtomic structures of silicene layers grown on Ag(111): scanning tunneling microscopy and noncontact atomic force microscopy observations.Structural development and energy dissipation in simulated silicon apices.Identifying passivated dynamic force microscopy tips on H:Si(100)Role of orbital overlap in atomic manipulationResolving oxide surfaces - From point and line defects to complex network structuresNoncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material Surfaces
P2860
Q24625340-5615C881-4D2A-48BB-9896-515BD58E65B5Q28544982-72979A1A-06CE-4D1F-A934-D6EB97A147F7Q41771023-44A8896B-9CA9-4632-9D86-C6C2CE7680D7Q41880083-7575D8D4-586E-4247-8478-0C2380382197Q58086869-9878351F-C080-497F-B463-630AC88C72AAQ58086909-5E19DCF8-A738-4667-B865-FD7758A4A5E4Q58319948-2F71C08F-5439-4067-BAD8-EFA533F10B4AQ59001855-9F83C8B2-EC5B-4C9D-948D-D9F40DB7F26E
P2860
Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe.
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2012 nî lūn-bûn
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2012年の論文
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2012年論文
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2012年論文
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2012年論文
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2012年論文
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name
Effect of the tip state during qPlus noncontact atomic force microscopy of Si
@nl
Effect of the tip state during ...... 00) at 5 K: Probing the probe.
@en
type
label
Effect of the tip state during qPlus noncontact atomic force microscopy of Si
@nl
Effect of the tip state during ...... 00) at 5 K: Probing the probe.
@en
prefLabel
Effect of the tip state during qPlus noncontact atomic force microscopy of Si
@nl
Effect of the tip state during ...... 00) at 5 K: Probing the probe.
@en
P2860
P356
P1476
Effect of the tip state during ...... 100) at 5 K: Probing the probe
@en
P2093
Adam Sweetman
Rosanna Danza
P2860
P356
10.3762/BJNANO.3.3
P577
2012-01-09T00:00:00Z