Probing adsorption sites on thin oxide films by dynamic force microscopy
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A portable microevaporator for low temperature single atom studies by scanning tunneling and dynamic force microscopy.Flexible drift-compensation system for precise 3D force mapping in severe drift environments.Combined low-temperature scanning tunneling/atomic force microscope for atomic resolution imaging and site-specific force spectroscopy.Driving a macroscopic oscillator with the stochastic motion of a hydrogen molecule.Apparatus for low temperature thermal desorption spectroscopy of portable samples.Recent trends in surface characterization and chemistry with high-resolution scanning force methods.A portable quartz micro balance for physical vapor deposition techniques.Charge Control in Model Catalysis: The Decisive Role of the Oxide-Nanoparticle Interface.Growth and structure of crystalline silica sheet on Ru(0001).Multichannel scanning probe microscopy and spectroscopy of graphene moiré structures.Resolving amorphous solid-liquid interfaces by atomic force microscopyEnhanced atomic corrugation in dynamic force microscopy—The role of repulsive forcesResolving oxide surfaces - From point and line defects to complex network structuresThree-dimensional electrostatic interactions in dynamic force microscopy: Experiment and theoryImaging of individual adatoms on oxide surfaces by dynamic force microscopyStructure and electronic properties of step edges in the aluminum oxide film on NiAl(110)Atomic resolution on a metal single crystal with dynamic force microscopyAtomically resolved force microscopy images of complex surface unit cells: Ultrathin alumina film on NiAl(110)Superlattice structure of an Ar monolayer on Ag(111) observed by low-temperature scanning tunneling microscopyNoncontact Atomic Force Microscopy for Atomic-Scale Characterization of Material Surfaces
P2860
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P2860
Probing adsorption sites on thin oxide films by dynamic force microscopy
description
im Dezember 2006 veröffentlichter wissenschaftlicher Artikel
@de
wetenschappelijk artikel
@nl
наукова стаття, опублікована в грудні 2006
@uk
name
Probing adsorption sites on thin oxide films by dynamic force microscopy
@en
Probing adsorption sites on thin oxide films by dynamic force microscopy
@nl
type
label
Probing adsorption sites on thin oxide films by dynamic force microscopy
@en
Probing adsorption sites on thin oxide films by dynamic force microscopy
@nl
prefLabel
Probing adsorption sites on thin oxide films by dynamic force microscopy
@en
Probing adsorption sites on thin oxide films by dynamic force microscopy
@nl
P2093
P2860
P356
P1476
Probing adsorption sites on thin oxide films by dynamic force microscopy
@en
P2093
G. H. Simon
H.-J. Freund
H.-P. Rust
P2860
P304
P356
10.1063/1.2424432
P407
P577
2006-12-25T00:00:00Z