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Atomic force microscope cantilever spring constant evaluation for higher mode oscillations: a kinetostatic method.Development of atomic force microscope with wide-band magnetic excitation for study of soft matter dynamics.Prediction of atomic force microscope probe dynamics through the receptance coupling method.Measurement of the Mass and Rigidity of Adsorbates on a Microcantilever Sensor.A local sensor for joint temperature and velocity measurements in turbulent flows.Tapered silicon nanowires for enhanced nanomechanical sensingQuantitative measurement of radiation pressure on a microcantilever in ambient environmentAmplitude dependence of image quality in atomically-resolved bimodal atomic force microscopy
P2860
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P2860
description
article
@en
im Juli 2000 veröffentlichter wissenschaftlicher Artikel
@de
wetenschappelijk artikel
@nl
наукова стаття, опублікована в липні 2000
@uk
name
Dynamics of damped cantilevers
@en
Dynamics of damped cantilevers
@nl
type
label
Dynamics of damped cantilevers
@en
Dynamics of damped cantilevers
@nl
prefLabel
Dynamics of damped cantilevers
@en
Dynamics of damped cantilevers
@nl
P2093
P356
P1476
Dynamics of damped cantilevers
@en
P2093
P304
P356
10.1063/1.1150690
P577
2000-07-01T00:00:00Z