Amplitude dependence of image quality in atomically-resolved bimodal atomic force microscopy
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Amplitude dependence of image quality in atomically-resolved bimodal atomic force microscopy
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im Oktober 2016 veröffentlichter wissenschaftlicher Artikel
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wetenschappelijk artikel
@nl
наукова стаття, опублікована в жовтні 2016
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name
Amplitude dependence of image ...... imodal atomic force microscopy
@en
Amplitude dependence of image ...... imodal atomic force microscopy
@nl
type
label
Amplitude dependence of image ...... imodal atomic force microscopy
@en
Amplitude dependence of image ...... imodal atomic force microscopy
@nl
prefLabel
Amplitude dependence of image ...... imodal atomic force microscopy
@en
Amplitude dependence of image ...... imodal atomic force microscopy
@nl
P2093
P2860
P356
P1476
Amplitude dependence of image ...... imodal atomic force microscopy
@en
P2093
Alfred J. Weymouth
Dominik Kirpal
Franz J. Giessibl
Hiroaki Ooe
Toyoko Arai
P2860
P304
P356
10.1063/1.4964125
P407
P577
2016-10-03T00:00:00Z
P818
1605.06584