about
X-ray Bragg Ptychography on a Single InGaN/GaN Core-Shell Nanowire.Diffraction based Hanbury Brown and Twiss interferometry at a hard x-ray free-electron laser.Structural Changes in a Single GaN Nanowire under Applied Voltage BiasStrain mapping inside an individual processed vertical nanowire transistor using scanning X-ray nanodiffraction
P50
description
researcher (ORCID 0000-0001-8398-9480)
@en
name
Dmitry Dzhigaev
@en
type
label
Dmitry Dzhigaev
@en
prefLabel
Dmitry Dzhigaev
@en
P31
P496
0000-0001-8398-9480