Strain mapping inside an individual processed vertical nanowire transistor using scanning X-ray nanodiffraction
about
Strain mapping inside an individual processed vertical nanowire transistor using scanning X-ray nanodiffraction
description
scientific article published on 12 June 2020
@en
name
Strain mapping inside an indiv ...... scanning X-ray nanodiffraction
@en
type
label
Strain mapping inside an indiv ...... scanning X-ray nanodiffraction
@en
prefLabel
Strain mapping inside an indiv ...... scanning X-ray nanodiffraction
@en
P2093
P50
P356
P1433
P1476
Strain mapping inside an indiv ...... scanning X-ray nanodiffraction
@en
P2093
Anders Mikkelsen
Sebastian Kalbfleisch
Zoltan Imre Balogh
P356
10.1039/D0NR02260H
P50
P577
2020-06-12T00:00:00Z