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Q27317177-BF3024A9-D701-4E80-8505-0188CB3F0192
Q27317177-BF3024A9-D701-4E80-8505-0188CB3F0192
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http://www.wikidata.org/entity/statement/Q27317177-BF3024A9-D701-4E80-8505-0188CB3F0192
Real-time direct and diffraction X-ray imaging of irregular silicon wafer breakage.
P2860
Q27317177-BF3024A9-D701-4E80-8505-0188CB3F0192
BestRank
Statement
http://www.wikidata.org/entity/statement/Q27317177-BF3024A9-D701-4E80-8505-0188CB3F0192
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ccabb931a306547e92a09d759d78713d2c811835
P2860
Crack propagation and fracture in silicon wafers under thermal stress