Phase separation and Si nanocrystal formation in bulk SiO studied by x-ray scattering
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Atomic-scale disproportionation in amorphous silicon monoxide.Planning, performing and analyzing X-ray Raman scattering experimentsPressure driven spin transition in siderite and magnesiosiderite single crystals.Spectroscopy of low and intermediateZelements at extreme conditions:in situstudies of Earth materials at pressure and temperature via X-ray Raman scatteringSuboxide interface in disproportionatinga-SiO studied by x-ray Raman scattering
P2860
Phase separation and Si nanocrystal formation in bulk SiO studied by x-ray scattering
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im Februar 2010 veröffentlichter wissenschaftlicher Artikel
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wetenschappelijk artikel
@nl
наукова стаття, опублікована в лютому 2010
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name
Phase separation and Si nanocrystal formation in bulk SiO studied by x-ray scattering
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Phase separation and Si nanocrystal formation in bulk SiO studied by x-ray scattering
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type
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Phase separation and Si nanocrystal formation in bulk SiO studied by x-ray scattering
@en
Phase separation and Si nanocrystal formation in bulk SiO studied by x-ray scattering
@nl
prefLabel
Phase separation and Si nanocrystal formation in bulk SiO studied by x-ray scattering
@en
Phase separation and Si nanocrystal formation in bulk SiO studied by x-ray scattering
@nl
P2093
P2860
P356
P1476
Phase separation and Si nanocrystal formation in bulk SiO studied by x-ray scattering
@en
P2093
Ch. J. Sahle
G. T. Seidler
H. Sternemann
J. Bradley
K. Pirkkalainen
M. A. Schroer
M. Balasubramanian
P2860
P304
P356
10.1063/1.3323106
P407
P577
2010-02-22T00:00:00Z