X-ray Raman scattering at the Si LII,III-edge of bulk amorphous SiO
about
Atomic-scale disproportionation in amorphous silicon monoxide.The local electronic structure of alpha-Li3N.Spectroscopy of low and intermediateZelements at extreme conditions:in situstudies of Earth materials at pressure and temperature via X-ray Raman scatteringSuboxide interface in disproportionatinga-SiO studied by x-ray Raman scatteringPhase separation and Si nanocrystal formation in bulk SiO studied by x-ray scatteringPhase separation and nanocrystal formation in GeONear-edge structure of nonresonant inelastic x-ray scattering fromL-shell core levels studied by a real-space multiple-scattering approach
P2860
Q36907212-1B4D2788-0A88-4A2F-8B02-44041AB60A06Q51871718-7BCA0871-48F6-4139-9AF3-887B9233DE60Q58809950-415D976F-E2BE-4984-8405-2D4FD73E9032Q58809983-68BD9C47-2CAF-4339-8032-617E74BE8F7DQ58809984-4DD77995-FAFF-47FD-A55F-DDA7A352F164Q58809989-D1F1E3ED-32DD-4713-A545-04CAC16F4086Q58810008-1CAB3AAB-3297-48E2-B051-C1ADCD5B318A
P2860
X-ray Raman scattering at the Si LII,III-edge of bulk amorphous SiO
description
wetenschappelijk artikel
@nl
наукова стаття, опублікована в грудні 2005
@uk
name
X-ray Raman scattering at the Si LII,III-edge of bulk amorphous SiO
@en
X-ray Raman scattering at the Si LII,III-edge of bulk amorphous SiO
@nl
type
label
X-ray Raman scattering at the Si LII,III-edge of bulk amorphous SiO
@en
X-ray Raman scattering at the Si LII,III-edge of bulk amorphous SiO
@nl
prefLabel
X-ray Raman scattering at the Si LII,III-edge of bulk amorphous SiO
@en
X-ray Raman scattering at the Si LII,III-edge of bulk amorphous SiO
@nl
P2093
P1476
X-ray Raman scattering at the Si LII,III-edge of bulk amorphous SiO
@en
P2093
P304
P356
10.1016/J.JPCS.2005.09.050
P577
2005-12-01T00:00:00Z