Advancing X-ray scattering metrology using inverse genetic algorithms.
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Advancing X-ray scattering metrology using inverse genetic algorithms.
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article científic
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article scientifique
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artigo científico
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bilimsel makale
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scientific article published on 07 July 2016
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Advancing X-ray scattering metrology using inverse genetic algorithms.
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Advancing X-ray scattering metrology using inverse genetic algorithms.
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Advancing X-ray scattering metrology using inverse genetic algorithms.
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Advancing X-ray scattering metrology using inverse genetic algorithms.
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Advancing X-ray scattering metrology using inverse genetic algorithms.
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Advancing X-ray scattering metrology using inverse genetic algorithms.
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P2093
P2860
P1476
Advancing X-ray scattering metrology using inverse genetic algorithms
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P2093
Adam F Hannon
Daniel F Sunday
Donald Windover
P2860
P356
10.1117/1.JMM.15.3.034001
P50
P577
2016-07-07T00:00:00Z