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Pathways towards ferroelectricity in hafniaEnhancement of the blue photoluminescence intensity for the porous silicon with HfO2 filling into microcavities.Fatigue mechanism of yttrium-doped hafnium oxide ferroelectric thin films fabricated by pulsed laser deposition.The demonstration of significant ferroelectricity in epitaxial Y-doped HfO2 filmTwo-step polarization switching mediated by a nonpolar intermediate phase in Hf0.4Zr0.6O2 thin films.A study on the wake-up effect of ferroelectric Hf0.5Zr0.5O2 films by pulse-switching measurement.Ferroelectricity and antiferroelectricity of doped thin HfO2-based films.Inductive crystallization effect of atomic-layer-deposited Hf0.5Zr0.5O2 films for ferroelectric application.Emerging Applications for High K Materials in VLSI Technology.Co-sputtering yttrium into hafnium oxide thin films to produce ferroelectric propertiesUnderstanding the formation of the metastable ferroelectric phase in hafnia-zirconia solid solution thin films.Surface and grain boundary energy as the key enabler of ferroelectricity in nanoscale hafnia-zirconia: a comparison of model and experiment.PbTiO3-based perovskite ferroelectric and multiferroic thin films.Crystal structure of Si-doped HfO2Si Doped Hafnium Oxide-A “Fragile” Ferroelectric SystemDoped Hf0.5Zr0.5O2 for high efficiency integrated supercapacitorsA comprehensive study on the structural evolution of HfO2 thin films doped with various dopantsStructural Changes Underlying Field-Cycling Phenomena in Ferroelectric HfO2Thin FilmsScaling Effects in Perovskite Ferroelectrics: Fundamental Limits and Process-Structure-Property RelationsPhysical Mechanisms behind the Field-Cycling Behavior of HfO2 -Based Ferroelectric CapacitorsMixed Al and Si doping in ferroelectric HfO2 thin filmsProcessing and crystallographic structure of non-equilibrium Si-doped HfO2Pressure-induced structures of Si-doped HfO2On the structural origins of ferroelectricity in HfO2 thin filmsTaN interface properties and electric field cycling effects on ferroelectric Si-doped HfO2 thin filmsThe effects of layering in ferroelectric Si-doped HfO2 thin filmsFormation of (111) orientation-controlled ferroelectric orthorhombic HfO2 thin films from solid phase via annealingGrowth of (111)-oriented epitaxial and textured ferroelectric Y-doped HfO2 films for downscaled devicesImpact of mechanical stress on ferroelectricity in (Hf0.5Zr0.5)O2 thin filmsOrientation control and domain structure analysis of {100}-oriented epitaxial ferroelectric orthorhombic HfO2-based thin filmsStabilizing the ferroelectric phase in doped hafnium oxide
P2860
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P2860
description
2011 nî lūn-bûn
@nan
2011 թուականի Սեպտեմբերին հրատարակուած գիտական յօդուած
@hyw
2011 թվականի սեպտեմբերին հրատարակված գիտական հոդված
@hy
2011年の論文
@ja
2011年論文
@yue
2011年論文
@zh-hant
2011年論文
@zh-hk
2011年論文
@zh-mo
2011年論文
@zh-tw
2011年论文
@wuu
name
Ferroelectricity in hafnium oxide thin films
@ast
Ferroelectricity in hafnium oxide thin films
@en
type
label
Ferroelectricity in hafnium oxide thin films
@ast
Ferroelectricity in hafnium oxide thin films
@en
prefLabel
Ferroelectricity in hafnium oxide thin films
@ast
Ferroelectricity in hafnium oxide thin films
@en
P2093
P3181
P356
P1476
Ferroelectricity in hafnium oxide thin films
@en
P2093
D. Bräuhaus
T. S. Böscke
U. Böttger
U. Schröder
P304
P3181
P356
10.1063/1.3634052
P407
P577
2011-09-05T00:00:00Z