Subatomic Features on the Silicon (111)-(7x7) Surface Observed by Atomic Force Microscopy.
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Probing the shape of atoms in real spaceCalculation of the effect of tip geometry on noncontact atomic force microscopy using a qPlus sensorPhantom Force Induced by Tunneling Current: A Characterization on Si(111)Advances in atomic force microscopyManipulating Si(100) at 5 K using qPlus frequency modulated atomic force microscopy: Role of defects and dynamics in the mechanical switching of atomsPrecise Orientation of a Single C 60 Molecule on the Tip of a Scanning Probe MicroscopePotential role of atomic force microscopy in systems biologySub-nanometer Resolution Imaging with Amplitude-modulation Atomic Force Microscopy in Liquid.Water distribution at solid/liquid interfaces visualized by frequency modulation atomic force microscopy.Imaging and three-dimensional reconstruction of chemical groups inside a protein complex using atomic force microscopy.Atomic force microscopy contact, tapping, and jumping modes for imaging biological samples in liquids.Revealing the hidden atom in graphite by low-temperature atomic force microscopy.The force needed to move an atom on a surface.Photothermal excitation and laser Doppler velocimetry of higher cantilever vibration modes for dynamic atomic force microscopy in liquid.Small single-crystal silicon cantilevers formed by crystal facets for atomic force microscopy.Imaging molecular structure and physiological function of gap junctions and hemijunctions by multimodal atomic force microscopy.Friction traced to the single atomRevealing the angular symmetry of chemical bonds by atomic force microscopy.Multidimensional atomic force microscopy: a versatile novel technology for nanopharmacology research.Identifying tips for intramolecular NC-AFM imaging via in situ fingerprinting.Surface structure. Subatomic resolution force microscopy reveals internal structure and adsorption sites of small iron clusters.The coefficient of the voltage induced frequency shift measurement on a quartz tuning fork.Fundamental quantum noise mapping with tunnelling microscopes tested at surface structures of subatomic lateral size.Development of a quartz tuning-fork-based force sensor for measurements in the tens of nanoNewton force range during nanomanipulation experiments.Mechanically stable tuning fork sensor with high quality factor for the atomic force microscope.The ReactorAFM: non-contact atomic force microscope operating under high-pressure and high-temperature catalytic conditions.Optical nanoscopy of transient states in condensed matterDevelopment of a detachable high speed miniature scanning probe microscope for large area substrates inspection.A simple method for the determination of qPlus sensor spring constants.High-resolution dynamic atomic force microscopy in liquids with different feedback architecturesRecent trends in surface characterization and chemistry with high-resolution scanning force methods.Single-molecule chemistry and physics explored by low-temperature scanning probe microscopy.Scanning ion conductance microscopy for studying biological samples.Direct imaging of individual intrinsic hydration layers on lipid bilayers at Angstrom resolution.Graphite, graphene on SiC, and graphene nanoribbons: Calculated images with a numerical FM-AFM.Effect of the tip state during qPlus noncontact atomic force microscopy of Si(100) at 5 K: Probing the probe.qPlus magnetic force microscopy in frequency-modulation mode with millihertz resolutionPiezoelectric tuning fork probe for atomic force microscopy imaging and specific recognition force spectroscopy of an enzyme and its ligand.A new tuning fork-based instrument for oscillatory shear rheology of nano-confined liquids.Atomic Force Microscopy Sidewall Imaging with a Quartz Tuning Fork Force Sensor.
P2860
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P2860
Subatomic Features on the Silicon (111)-(7x7) Surface Observed by Atomic Force Microscopy.
description
2000 nî lūn-bûn
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2000 թուականի Յուլիսին հրատարակուած գիտական յօդուած
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2000 թվականի հուլիսին հրատարակված գիտական հոդված
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2000年の論文
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2000年論文
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2000年論文
@zh-hant
2000年論文
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2000年論文
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2000年論文
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2000年论文
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name
Subatomic Features on the Sili ...... ed by Atomic Force Microscopy.
@ast
Subatomic Features on the Sili ...... ed by Atomic Force Microscopy.
@en
type
label
Subatomic Features on the Sili ...... ed by Atomic Force Microscopy.
@ast
Subatomic Features on the Sili ...... ed by Atomic Force Microscopy.
@en
prefLabel
Subatomic Features on the Sili ...... ed by Atomic Force Microscopy.
@ast
Subatomic Features on the Sili ...... ed by Atomic Force Microscopy.
@en
P1433
P1476
Subatomic Features on the Silicon (111)-(7x7) Surface Observed by Atomic Force Microscopy
@en
P2093
Bielefeldt H
Hembacher S
P304
P356
10.1126/SCIENCE.289.5478.422
P407
P577
2000-07-01T00:00:00Z