A low temperature scanning tunneling microscope for electronic and force spectroscopy.
about
A subKelvin scanning probe microscope for the electronic spectroscopy of an individual nano-device.Compact very low temperature scanning tunneling microscope with mechanically driven horizontal linear positioning stage.Calibration of piezoelectric positioning actuators using a reference voltage-to-displacement transducer based on quartz tuning forks.Carbon-fiber tips for scanning probe microscopes and molecular electronics experiments.
P2860
A low temperature scanning tunneling microscope for electronic and force spectroscopy.
description
2007 nî lūn-bûn
@nan
2007 թուականի Նոյեմբերին հրատարակուած գիտական յօդուած
@hyw
2007 թվականի նոյեմբերին հրատարակված գիտական հոդված
@hy
2007年の論文
@ja
2007年論文
@yue
2007年論文
@zh-hant
2007年論文
@zh-hk
2007年論文
@zh-mo
2007年論文
@zh-tw
2007年论文
@wuu
name
A low temperature scanning tunneling microscope for electronic and force spectroscopy.
@ast
A low temperature scanning tunneling microscope for electronic and force spectroscopy.
@en
A low temperature scanning tunneling microscope for electronic and force spectroscopy.
@nl
type
label
A low temperature scanning tunneling microscope for electronic and force spectroscopy.
@ast
A low temperature scanning tunneling microscope for electronic and force spectroscopy.
@en
A low temperature scanning tunneling microscope for electronic and force spectroscopy.
@nl
prefLabel
A low temperature scanning tunneling microscope for electronic and force spectroscopy.
@ast
A low temperature scanning tunneling microscope for electronic and force spectroscopy.
@en
A low temperature scanning tunneling microscope for electronic and force spectroscopy.
@nl
P2093
P2860
P356
P1476
A low temperature scanning tunneling microscope for electronic and force spectroscopy.
@en
P2093
Riquelme JJ
Rubio-Bollinger G
P2860
P304
P356
10.1063/1.2804165
P407
P577
2007-11-01T00:00:00Z