Kelvin probe force microscopy for local characterisation of active nanoelectronic devices

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Exfoliation of two-dimensional polymer single crystals into thin sheets and investigations of their surface structure by high-resolution atomic force microscopy.Combined scanning probe electronic and thermal characterization of an indium arsenide nanowire.

P2860

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P2860

Kelvin probe force microscopy for local characterisation of active nanoelectronic devices

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Kelvin probe force microscopy for local characterisation of active nanoelectronic devices

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Kelvin probe force microscopy for local characterisation of active nanoelectronic devices

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Item

label

Kelvin probe force microscopy for local characterisation of active nanoelectronic devices

@ast

Kelvin probe force microscopy for local characterisation of active nanoelectronic devices

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prefLabel

Kelvin probe force microscopy for local characterisation of active nanoelectronic devices

@ast

Kelvin probe force microscopy for local characterisation of active nanoelectronic devices

@en

P1476

Kelvin probe force microscopy for local characterisation of active nanoelectronic devices

@en

P2093

Andreas Stemmer

http://www.w3.org/2001/XMLSchema#string

Heike Riel

http://www.w3.org/2001/XMLSchema#string

Patrick Reissner

http://www.w3.org/2001/XMLSchema#string

Philipp Mensch

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P2860

Noise performance of frequency modulation Kelvin force microscopy

Single-pass Kelvin force microscopy and dC/dZ measurements in the intermittent contact: applications to polymer materials.

Note: switching crosstalk on and off in Kelvin Probe Force Microscopy.

Thermal noise limit for ultra-high vacuum noncontact atomic force microscopy.

Feed-forward compensation of surface potential in atomic force microscopy.

Surface potential imaging with atomic resolution by frequency-modulation Kelvin probe force microscopy without bias voltage feedback.

Reconstruction of surface potential from Kelvin probe force microscopy images.

P304

2193-2206

http://www.w3.org/2001/XMLSchema#string

P31

scholarly article

P356

10.3762/BJNANO.6.225

http://www.w3.org/2001/XMLSchema#string

P478

http://www.w3.org/2001/XMLSchema#string

P50

Tino Wagner

Hannes Beyer

Bernd Gotsmann

P577

2015-11-23T00:00:00Z

http://www.w3.org/2001/XMLSchema#dateTime

P5875

284547807

http://www.w3.org/2001/XMLSchema#string

P698

26734511

http://www.w3.org/2001/XMLSchema#string

P932

4685916

http://www.w3.org/2001/XMLSchema#string

Kelvin probe force microscopy for local characterisation of active nanoelectronic devices

about

P2860

P2860

Kelvin probe force microscopy for local characterisation of active nanoelectronic devices

description

name

type

label

prefLabel

P1433

P1476

P2093

P2860

P304

P31

P356

P478

P50

P577

P5875

P698

P932

P356

P1433

P1476

P2093

P2860

P304

P31

P356

P478

P50

P577

P5875

P698

P932