Kelvin probe force microscopy for local characterisation of active nanoelectronic devices
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Kelvin probe force microscopy for local characterisation of active nanoelectronic devices
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2015 nî lūn-bûn
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2015年の論文
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Kelvin probe force microscopy for local characterisation of active nanoelectronic devices
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Kelvin probe force microscopy for local characterisation of active nanoelectronic devices
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Kelvin probe force microscopy for local characterisation of active nanoelectronic devices
@ast
Kelvin probe force microscopy for local characterisation of active nanoelectronic devices
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prefLabel
Kelvin probe force microscopy for local characterisation of active nanoelectronic devices
@ast
Kelvin probe force microscopy for local characterisation of active nanoelectronic devices
@en
P2093
P2860
P50
P356
P1476
Kelvin probe force microscopy for local characterisation of active nanoelectronic devices
@en
P2093
Andreas Stemmer
Heike Riel
Patrick Reissner
Philipp Mensch
P2860
P304
P356
10.3762/BJNANO.6.225
P577
2015-11-23T00:00:00Z