Single-pass Kelvin force microscopy and dC/dZ measurements in the intermittent contact: applications to polymer materials.
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Reversible mechano-electrochemical writing of metallic nanostructures with the tip of an atomic force microscopeKelvin probe force microscopy for local characterisation of active nanoelectronic devicesPolymer blend lithography: A versatile method to fabricate nanopatterned self-assembled monolayers.Nanoconfined water can orient and cause long-range dipolar interactions with biomolecules.Compositional mapping of bitumen using local electrostatic force interactions in atomic force microscopy.Dipole-like electrostatic asymmetry of gold nanorods.Surface potential of diamond and gold nanoparticles can be locally switched by surrounding materials or applied voltageSwitching polarity of oxidized detonation diamond nanoparticles on substrates
P2860
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P2860
Single-pass Kelvin force microscopy and dC/dZ measurements in the intermittent contact: applications to polymer materials.
description
2011 nî lūn-bûn
@nan
2011年の論文
@ja
2011年論文
@yue
2011年論文
@zh-hant
2011年論文
@zh-hk
2011年論文
@zh-mo
2011年論文
@zh-tw
2011年论文
@wuu
2011年论文
@zh
2011年论文
@zh-cn
name
Single-pass Kelvin force micro ...... ications to polymer materials.
@en
type
label
Single-pass Kelvin force micro ...... ications to polymer materials.
@en
prefLabel
Single-pass Kelvin force micro ...... ications to polymer materials.
@en
P356
P1476
Single-pass Kelvin force micro ...... ications to polymer materials.
@en
P2093
John Alexander
Sergei Magonov
P2860
P356
10.3762/BJNANO.2.2
P577
2011-01-06T00:00:00Z