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Q36389794-2C01EFC0-143E-4F37-8BB4-CBCF92A8B69A
Q36389794-2C01EFC0-143E-4F37-8BB4-CBCF92A8B69A
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http://www.wikidata.org/entity/statement/Q36389794-2C01EFC0-143E-4F37-8BB4-CBCF92A8B69A
Kelvin probe force microscopy for local characterisation of active nanoelectronic devices
P2860
Q36389794-2C01EFC0-143E-4F37-8BB4-CBCF92A8B69A
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http://www.wikidata.org/entity/statement/Q36389794-2C01EFC0-143E-4F37-8BB4-CBCF92A8B69A
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1d601de59b3be28178e80d1f8c1af2b83752333f
P2860
Single-pass Kelvin force microscopy and dC/dZ measurements in the intermittent contact: applications to polymer materials.