Atom inlays performed at room temperature using atomic force microscopy.
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Resolving Intra- and Inter-Molecular Structure with Non-Contact Atomic Force MicroscopyManipulating Si(100) at 5 K using qPlus frequency modulated atomic force microscopy: Role of defects and dynamics in the mechanical switching of atomsA portable microevaporator for low temperature single atom studies by scanning tunneling and dynamic force microscopy.The force needed to move an atom on a surface.Complex patterning by vertical interchange atom manipulation using atomic force microscopy.Measuring the charge state of an adatom with noncontact atomic force microscopy.Recent advances in submolecular resolution with scanning probe microscopy.Angled long tip to tuning fork probes for atomic force microscopy in various environments.Facilitating the pickup of individual DNA molecules by AFM nanomanipulation with tips mechanically worn on bare mica.Nano-chemistry and scanning probe nanolithographies.Mechanical gate control for atom-by-atom cluster assembly with scanning probe microscopy.Atomic-Level Sculpting of Crystalline Oxides: Toward Bulk Nanofabrication with Single Atomic Plane Precision.Nanomanipulation and controlled self-assembly of metal nanoparticles and nanocrystals for plasmonics.Recent trends in surface characterization and chemistry with high-resolution scanning force methods.Single-molecule chemistry and physics explored by low-temperature scanning probe microscopy.Classic, liquid, and matrix-assisted dip-pen nanolithography for materials research.Self-assembly of regenerated silk fibroin from random coil nanostructures to antiparallel β-sheet nanostructures.A collisional model for AFM manipulation of rigid nanoparticles.Interpreting motion and force for narrow-band intermodulation atomic force microscopy.Reversible bond formation in a gold-atom-organic-molecule complex as a molecular switch.Mechanism for room-temperature single-atom lateral manipulations on semiconductors using dynamic force microscopy.Single atomic contact adhesion and dissipation in dynamic force microscopy.Room-temperature-concerted switch made of a binary atom cluster.Combined pulsed laser deposition and non-contact atomic force microscopy system for studies of insulator metal oxide thin films.Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonatorsImaging of individual adatoms on oxide surfaces by dynamic force microscopyAtom manipulation on an insulating surface at room temperatureForce Field Analysis Suggests a Lowering of Diffusion Barriers in Atomic Manipulation Due to Presence of STM TipExploring the nanoworld with atomic force microscopyReal topography, atomic relaxations, and short-range chemical interactions in atomic force microscopy: The case of theα−Sn∕Si(111)−(3×3)R30°surface
P2860
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P2860
Atom inlays performed at room temperature using atomic force microscopy.
description
2005 nî lūn-bûn
@nan
2005年の論文
@ja
2005年学术文章
@wuu
2005年学术文章
@zh
2005年学术文章
@zh-cn
2005年学术文章
@zh-hans
2005年学术文章
@zh-my
2005年学术文章
@zh-sg
2005年學術文章
@yue
2005年學術文章
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name
Atom inlays performed at room temperature using atomic force microscopy.
@en
Atom inlays performed at room temperature using atomic force microscopy.
@nl
type
label
Atom inlays performed at room temperature using atomic force microscopy.
@en
Atom inlays performed at room temperature using atomic force microscopy.
@nl
prefLabel
Atom inlays performed at room temperature using atomic force microscopy.
@en
Atom inlays performed at room temperature using atomic force microscopy.
@nl
P2093
P2860
P356
P1433
P1476
Atom inlays performed at room temperature using atomic force microscopy.
@en
P2093
Masayuki Abe
Noriaki Oyabu
Seizo Morita
Shinji Hirayama
Yoshiaki Sugimoto
P2860
P2888
P304
P356
10.1038/NMAT1297
P407
P577
2005-01-16T00:00:00Z
P5875
P6179
1002495621